{"title":"基于大功率条件下SiC MOSFET开关损耗的相位计算方法","authors":"Zhi Zheng, Yijun Wang, Feng Wang, F. Zhuo","doi":"10.1109/ICPET55165.2022.9918410","DOIUrl":null,"url":null,"abstract":"As an emerging wide-bandgap semiconductor device, SiC MOSFET provides the advantages of high frequency, high efficiency and high power density for power electronic devices due to its excellent performance. As an important factor to study the switching performance of devices, switching loss is of great significance to its accurate calculation. This paper firstly analyzes the turn-on and turn-off processes of SiC MOSFETs, subdivides them into ten stages, and obtains the calculation method of switching losses in each stage. Then the corresponding switching loss value is obtained through simulation and experiment. Finally, the loss value calculated by the proposed calculation method is compared with the simulation and experiment, which verifies the high accuracy of the loss calculation method.","PeriodicalId":355634,"journal":{"name":"2022 4th International Conference on Power and Energy Technology (ICPET)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Phased Calculation Method of Switching Loss of SiC MOSFET Based on High Power Conditions\",\"authors\":\"Zhi Zheng, Yijun Wang, Feng Wang, F. Zhuo\",\"doi\":\"10.1109/ICPET55165.2022.9918410\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As an emerging wide-bandgap semiconductor device, SiC MOSFET provides the advantages of high frequency, high efficiency and high power density for power electronic devices due to its excellent performance. As an important factor to study the switching performance of devices, switching loss is of great significance to its accurate calculation. This paper firstly analyzes the turn-on and turn-off processes of SiC MOSFETs, subdivides them into ten stages, and obtains the calculation method of switching losses in each stage. Then the corresponding switching loss value is obtained through simulation and experiment. Finally, the loss value calculated by the proposed calculation method is compared with the simulation and experiment, which verifies the high accuracy of the loss calculation method.\",\"PeriodicalId\":355634,\"journal\":{\"name\":\"2022 4th International Conference on Power and Energy Technology (ICPET)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-07-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 4th International Conference on Power and Energy Technology (ICPET)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICPET55165.2022.9918410\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 4th International Conference on Power and Energy Technology (ICPET)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPET55165.2022.9918410","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
SiC MOSFET作为一种新兴的宽带隙半导体器件,以其优异的性能为电力电子器件提供了高频、高效率和高功率密度的优势。开关损耗作为研究器件开关性能的重要因素,其精确计算具有重要意义。本文首先分析了SiC mosfet的导通和关断过程,并将其细分为10级,得到了每级开关损耗的计算方法。然后通过仿真和实验得到相应的开关损耗值。最后,将所提出的计算方法计算出的损耗值与仿真和实验结果进行了比较,验证了损耗计算方法的准确性。
A Phased Calculation Method of Switching Loss of SiC MOSFET Based on High Power Conditions
As an emerging wide-bandgap semiconductor device, SiC MOSFET provides the advantages of high frequency, high efficiency and high power density for power electronic devices due to its excellent performance. As an important factor to study the switching performance of devices, switching loss is of great significance to its accurate calculation. This paper firstly analyzes the turn-on and turn-off processes of SiC MOSFETs, subdivides them into ten stages, and obtains the calculation method of switching losses in each stage. Then the corresponding switching loss value is obtained through simulation and experiment. Finally, the loss value calculated by the proposed calculation method is compared with the simulation and experiment, which verifies the high accuracy of the loss calculation method.