基于大功率条件下SiC MOSFET开关损耗的相位计算方法

Zhi Zheng, Yijun Wang, Feng Wang, F. Zhuo
{"title":"基于大功率条件下SiC MOSFET开关损耗的相位计算方法","authors":"Zhi Zheng, Yijun Wang, Feng Wang, F. Zhuo","doi":"10.1109/ICPET55165.2022.9918410","DOIUrl":null,"url":null,"abstract":"As an emerging wide-bandgap semiconductor device, SiC MOSFET provides the advantages of high frequency, high efficiency and high power density for power electronic devices due to its excellent performance. As an important factor to study the switching performance of devices, switching loss is of great significance to its accurate calculation. This paper firstly analyzes the turn-on and turn-off processes of SiC MOSFETs, subdivides them into ten stages, and obtains the calculation method of switching losses in each stage. Then the corresponding switching loss value is obtained through simulation and experiment. Finally, the loss value calculated by the proposed calculation method is compared with the simulation and experiment, which verifies the high accuracy of the loss calculation method.","PeriodicalId":355634,"journal":{"name":"2022 4th International Conference on Power and Energy Technology (ICPET)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Phased Calculation Method of Switching Loss of SiC MOSFET Based on High Power Conditions\",\"authors\":\"Zhi Zheng, Yijun Wang, Feng Wang, F. Zhuo\",\"doi\":\"10.1109/ICPET55165.2022.9918410\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As an emerging wide-bandgap semiconductor device, SiC MOSFET provides the advantages of high frequency, high efficiency and high power density for power electronic devices due to its excellent performance. As an important factor to study the switching performance of devices, switching loss is of great significance to its accurate calculation. This paper firstly analyzes the turn-on and turn-off processes of SiC MOSFETs, subdivides them into ten stages, and obtains the calculation method of switching losses in each stage. Then the corresponding switching loss value is obtained through simulation and experiment. Finally, the loss value calculated by the proposed calculation method is compared with the simulation and experiment, which verifies the high accuracy of the loss calculation method.\",\"PeriodicalId\":355634,\"journal\":{\"name\":\"2022 4th International Conference on Power and Energy Technology (ICPET)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-07-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 4th International Conference on Power and Energy Technology (ICPET)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICPET55165.2022.9918410\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 4th International Conference on Power and Energy Technology (ICPET)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPET55165.2022.9918410","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

SiC MOSFET作为一种新兴的宽带隙半导体器件,以其优异的性能为电力电子器件提供了高频、高效率和高功率密度的优势。开关损耗作为研究器件开关性能的重要因素,其精确计算具有重要意义。本文首先分析了SiC mosfet的导通和关断过程,并将其细分为10级,得到了每级开关损耗的计算方法。然后通过仿真和实验得到相应的开关损耗值。最后,将所提出的计算方法计算出的损耗值与仿真和实验结果进行了比较,验证了损耗计算方法的准确性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Phased Calculation Method of Switching Loss of SiC MOSFET Based on High Power Conditions
As an emerging wide-bandgap semiconductor device, SiC MOSFET provides the advantages of high frequency, high efficiency and high power density for power electronic devices due to its excellent performance. As an important factor to study the switching performance of devices, switching loss is of great significance to its accurate calculation. This paper firstly analyzes the turn-on and turn-off processes of SiC MOSFETs, subdivides them into ten stages, and obtains the calculation method of switching losses in each stage. Then the corresponding switching loss value is obtained through simulation and experiment. Finally, the loss value calculated by the proposed calculation method is compared with the simulation and experiment, which verifies the high accuracy of the loss calculation method.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信