{"title":"基于开关特性近似的RCD缓冲器设计。2仿真与实验结果","authors":"Z. Hossain, K. Olejniczak, K. Burgers, J. Balda","doi":"10.1109/IEMDC.1997.604254","DOIUrl":null,"url":null,"abstract":"A theoretical analysis of the switching behavior of the MOS-controlled thyristor (MCT), with and without stray inductances present, under different snubbering conditions has been presented in a companion paper. In order to verify these theoretical results, a hard-switched experimental test circuit was constructed. In this paper, a comparison is made among the newly-derived analytical, PSpice simulation and experimental results.","PeriodicalId":176640,"journal":{"name":"1997 IEEE International Electric Machines and Drives Conference Record","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design of RCD snubbers based upon approximations to the switching characteristics. II. Simulation and experimental results\",\"authors\":\"Z. Hossain, K. Olejniczak, K. Burgers, J. Balda\",\"doi\":\"10.1109/IEMDC.1997.604254\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A theoretical analysis of the switching behavior of the MOS-controlled thyristor (MCT), with and without stray inductances present, under different snubbering conditions has been presented in a companion paper. In order to verify these theoretical results, a hard-switched experimental test circuit was constructed. In this paper, a comparison is made among the newly-derived analytical, PSpice simulation and experimental results.\",\"PeriodicalId\":176640,\"journal\":{\"name\":\"1997 IEEE International Electric Machines and Drives Conference Record\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-05-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1997 IEEE International Electric Machines and Drives Conference Record\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMDC.1997.604254\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE International Electric Machines and Drives Conference Record","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMDC.1997.604254","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of RCD snubbers based upon approximations to the switching characteristics. II. Simulation and experimental results
A theoretical analysis of the switching behavior of the MOS-controlled thyristor (MCT), with and without stray inductances present, under different snubbering conditions has been presented in a companion paper. In order to verify these theoretical results, a hard-switched experimental test circuit was constructed. In this paper, a comparison is made among the newly-derived analytical, PSpice simulation and experimental results.
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