下一代测试发生器(NGTG)模拟电路

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century Pub Date : 1997-09-22 DOI:10.1109/AUTEST.1997.633580

L. Venetsky, S. Singer

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引用次数: 3

摘要

本文介绍了一个在学习模式下自动生成模拟被测单元(Unit Under Test, UUT)的测试，然后在生产模式下部署该系统进行故障检测和隔离的系统。NGTG由以下主要部分组成:a)最小化输入测试模式发生器，b) UUT模拟器，最后但并非最不重要的是c)评估系统。NGTG是一个利用模糊Artmap神经网络进行故障诊断和检测，利用遗传算法进行测试生成和故障覆盖优化的过程。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Next generation test generator (NGTG) for analog circuits

This paper describes a system that automatically generates tests for an analog Unit Under Test (UUT) in learning mode, and then deploys the system for fault detection and isolation in the production mode. The NGTG consists of the following main components: a) minimized input test pattern generator, b) UUT simulator, and last but not least c) evaluation system. The NGTG is a process that utilizes Fuzzy Artmap neural network for fault diagnostics and detection and genetic algorithm for test generation and fault coverage optimization.

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来源期刊

1997 IEEE Autotestcon Proceedings AUTOTESTCON '97. IEEE Systems Readiness Technology Conference. Systems Readiness Supporting Global Needs and Awareness in the 21st Century

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