采用多尺度法计算高电感VLSI互连匝道响应的阈值穿越时间

2008 12th IEEE Workshop on Signal Propagation on Interconnects Pub Date : 2008-05-12 DOI:10.1109/SPI.2008.4558391

A. Ligocka, W. Bandurski

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引用次数: 1

摘要

本文提出了一种新的推导低损耗片上互连输出电压和阈值穿越时间闭合公式的方法，并推导了斜坡励磁的阈值穿越时间解。给出了斜坡输入时两个耦合互连输出电压的计算方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Using Multiple Scales Method to calculate threshold crossing time for the ramp response for high inductance VLSI interconnects

The paper presents a new method of deriving the closed form formula for the output voltage and threshold crossing time for low-loss on-chip upper layer interconnects The threshold crossing time solution for the ramp excitation is derived. The calculation of output voltage of two coupled interconnects for the ramp input is also presented.

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2008 12th IEEE Workshop on Signal Propagation on Interconnects

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