富缺陷外延对晶硅/非晶硅异质结太阳能电池的影响及使用低迁移率层提高性能

M. Deceglie, H. Atwater
{"title":"富缺陷外延对晶硅/非晶硅异质结太阳能电池的影响及使用低迁移率层提高性能","authors":"M. Deceglie, H. Atwater","doi":"10.1109/PVSC.2011.6186222","DOIUrl":null,"url":null,"abstract":"We present two-dimensional device physics simulations of amorphous silicon / crystalline silicon heterojunction solar cells to explain the effects of full and localized epitaxial layers, sometimes observed in the early stages of amorphous Si deposition, on cell performance. Minimizing the defect density, thickness, and wafer area fraction covered by the epitaxial region are shown to be important factors for maximizing cell open circuit voltage. We find that localized defect-rich epitaxial patches covering small percentages of the wafer surface (∼5%) can cause significant reduction in open circuit voltage, which is explained by considering lateral carrier flow in the device. We also show that a thin layer of low-mobility material, such as microcrystalline silicon, included between the wafer and amorphous regions can impede lateral carrier flow and improve conversion efficiencies in cases where isolated defective pinholes limit device performance.","PeriodicalId":373149,"journal":{"name":"2011 37th IEEE Photovoltaic Specialists Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Effect of defect-rich epitaxy on crystalline silicon / amorphous silicon heterojunction solar cells and the use of low-mobility layers to improve peformance\",\"authors\":\"M. Deceglie, H. Atwater\",\"doi\":\"10.1109/PVSC.2011.6186222\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present two-dimensional device physics simulations of amorphous silicon / crystalline silicon heterojunction solar cells to explain the effects of full and localized epitaxial layers, sometimes observed in the early stages of amorphous Si deposition, on cell performance. Minimizing the defect density, thickness, and wafer area fraction covered by the epitaxial region are shown to be important factors for maximizing cell open circuit voltage. We find that localized defect-rich epitaxial patches covering small percentages of the wafer surface (∼5%) can cause significant reduction in open circuit voltage, which is explained by considering lateral carrier flow in the device. We also show that a thin layer of low-mobility material, such as microcrystalline silicon, included between the wafer and amorphous regions can impede lateral carrier flow and improve conversion efficiencies in cases where isolated defective pinholes limit device performance.\",\"PeriodicalId\":373149,\"journal\":{\"name\":\"2011 37th IEEE Photovoltaic Specialists Conference\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-06-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 37th IEEE Photovoltaic Specialists Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC.2011.6186222\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 37th IEEE Photovoltaic Specialists Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2011.6186222","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

摘要

我们提出了非晶硅/晶体硅异质结太阳能电池的二维器件物理模拟,以解释在非晶硅沉积的早期阶段有时观察到的完整和局部外延层对电池性能的影响。最小化缺陷密度、厚度和外延区覆盖的晶圆面积是最大化电池开路电压的重要因素。我们发现覆盖一小部分晶圆表面(~ 5%)的局部富含缺陷的外延片可以显著降低开路电压,这可以通过考虑器件中的横向载流子流来解释。我们还表明,在晶圆和非晶区之间包含一层薄的低迁移率材料,如微晶硅,可以阻止横向载流子流动,并在孤立的缺陷针孔限制器件性能的情况下提高转换效率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of defect-rich epitaxy on crystalline silicon / amorphous silicon heterojunction solar cells and the use of low-mobility layers to improve peformance
We present two-dimensional device physics simulations of amorphous silicon / crystalline silicon heterojunction solar cells to explain the effects of full and localized epitaxial layers, sometimes observed in the early stages of amorphous Si deposition, on cell performance. Minimizing the defect density, thickness, and wafer area fraction covered by the epitaxial region are shown to be important factors for maximizing cell open circuit voltage. We find that localized defect-rich epitaxial patches covering small percentages of the wafer surface (∼5%) can cause significant reduction in open circuit voltage, which is explained by considering lateral carrier flow in the device. We also show that a thin layer of low-mobility material, such as microcrystalline silicon, included between the wafer and amorphous regions can impede lateral carrier flow and improve conversion efficiencies in cases where isolated defective pinholes limit device performance.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信