容错逆变器的研究

F. Khelifi, B. Nadji
{"title":"容错逆变器的研究","authors":"F. Khelifi, B. Nadji","doi":"10.1109/DEMPED.2013.6645766","DOIUrl":null,"url":null,"abstract":"This work describes the operation of the fault tolerant inverter. The consequences of the switch defect in a traditional voltage inverter are analyzed. The studied failures are the short-circuit defect and the opening defect. The consequences of transistor defect leading to a final state of short-circuit or open circuit are discussed. It was proposed to implement a topology of fault-tolerant inverter with four-arms. The use of this inverter allows the increase in the availability of the converter. All simulations were done with the PSIM 7.1.2 software.","PeriodicalId":425644,"journal":{"name":"2013 9th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED)","volume":"156 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Study of fault — Tolerant inverter\",\"authors\":\"F. Khelifi, B. Nadji\",\"doi\":\"10.1109/DEMPED.2013.6645766\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work describes the operation of the fault tolerant inverter. The consequences of the switch defect in a traditional voltage inverter are analyzed. The studied failures are the short-circuit defect and the opening defect. The consequences of transistor defect leading to a final state of short-circuit or open circuit are discussed. It was proposed to implement a topology of fault-tolerant inverter with four-arms. The use of this inverter allows the increase in the availability of the converter. All simulations were done with the PSIM 7.1.2 software.\",\"PeriodicalId\":425644,\"journal\":{\"name\":\"2013 9th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED)\",\"volume\":\"156 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 9th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DEMPED.2013.6645766\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 9th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DEMPED.2013.6645766","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

本文介绍了容错逆变器的工作原理。分析了传统电压逆变器开关缺陷造成的后果。所研究的故障是短路缺陷和开路缺陷。讨论了晶体管缺陷最终导致短路或开路的后果。提出了一种四臂容错逆变器拓扑结构的实现方法。使用这种逆变器可以增加转换器的可用性。所有模拟均采用PSIM 7.1.2软件进行。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study of fault — Tolerant inverter
This work describes the operation of the fault tolerant inverter. The consequences of the switch defect in a traditional voltage inverter are analyzed. The studied failures are the short-circuit defect and the opening defect. The consequences of transistor defect leading to a final state of short-circuit or open circuit are discussed. It was proposed to implement a topology of fault-tolerant inverter with four-arms. The use of this inverter allows the increase in the availability of the converter. All simulations were done with the PSIM 7.1.2 software.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信