FANTASI:一种用于快速估计自旋电子学中写入错误率的新型器件到电路仿真框架

Venkata Pavan Kumar Miriyala
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引用次数: 4

摘要

尽管自旋传递转矩(STT)、自旋轨道转矩(SOT)和电压控制磁各向异性(VCMA)等物理机制有可能实现自旋电子器件的高效和超快速开关,但由于热波动,开关动力学是随机的。因此,在自旋电子学中有必要了解电路设计与开关机制中的错误率(称为写错误率)之间的相互作用。在本文中,我们提出了一个新的器件到电路仿真框架(FANTASI),用于快速估计不同自旋电子器件和电路中的写入错误率(WER)。在这里,我们表明,FANTASI实现了有效的自旋电子器件电路协同设计,结果与实验测量结果很好地吻合。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
FANTASI: A novel devices-to-circuits simulation framework for fast estimation of write error rates in spintronics
Though physical mechanisms such as spin-transfer torque (STT), spin-orbit torque (SOT), and voltage-controlled magnetic anisotropy (VCMA) has potential to enable energyefficient and ultra-fast switching of spintronic devices, the switching dynamics are stochastic due to thermal fluctuations. Thus, there is a need in spintronics to understand the interactions between circuit design and the error rate in the switching mechanism, called as write error rate. In this paper, we propose a novel devices-to-circuits simulation framework (FANTASI) for fast estimation of the write error rates (WER) in different spintronic devices and circuits. Here, we show that, FANTASI enables efficient spintronic device-circuit co-design, with results in good agreement with the experimental measurements.
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