{"title":"FANTASI:一种用于快速估计自旋电子学中写入错误率的新型器件到电路仿真框架","authors":"Venkata Pavan Kumar Miriyala","doi":"10.1109/SISPAD.2018.8551656","DOIUrl":null,"url":null,"abstract":"Though physical mechanisms such as spin-transfer torque (STT), spin-orbit torque (SOT), and voltage-controlled magnetic anisotropy (VCMA) has potential to enable energyefficient and ultra-fast switching of spintronic devices, the switching dynamics are stochastic due to thermal fluctuations. Thus, there is a need in spintronics to understand the interactions between circuit design and the error rate in the switching mechanism, called as write error rate. In this paper, we propose a novel devices-to-circuits simulation framework (FANTASI) for fast estimation of the write error rates (WER) in different spintronic devices and circuits. Here, we show that, FANTASI enables efficient spintronic device-circuit co-design, with results in good agreement with the experimental measurements.","PeriodicalId":170070,"journal":{"name":"2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"FANTASI: A novel devices-to-circuits simulation framework for fast estimation of write error rates in spintronics\",\"authors\":\"Venkata Pavan Kumar Miriyala\",\"doi\":\"10.1109/SISPAD.2018.8551656\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Though physical mechanisms such as spin-transfer torque (STT), spin-orbit torque (SOT), and voltage-controlled magnetic anisotropy (VCMA) has potential to enable energyefficient and ultra-fast switching of spintronic devices, the switching dynamics are stochastic due to thermal fluctuations. Thus, there is a need in spintronics to understand the interactions between circuit design and the error rate in the switching mechanism, called as write error rate. In this paper, we propose a novel devices-to-circuits simulation framework (FANTASI) for fast estimation of the write error rates (WER) in different spintronic devices and circuits. Here, we show that, FANTASI enables efficient spintronic device-circuit co-design, with results in good agreement with the experimental measurements.\",\"PeriodicalId\":170070,\"journal\":{\"name\":\"2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)\",\"volume\":\"87 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SISPAD.2018.8551656\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SISPAD.2018.8551656","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
FANTASI: A novel devices-to-circuits simulation framework for fast estimation of write error rates in spintronics
Though physical mechanisms such as spin-transfer torque (STT), spin-orbit torque (SOT), and voltage-controlled magnetic anisotropy (VCMA) has potential to enable energyefficient and ultra-fast switching of spintronic devices, the switching dynamics are stochastic due to thermal fluctuations. Thus, there is a need in spintronics to understand the interactions between circuit design and the error rate in the switching mechanism, called as write error rate. In this paper, we propose a novel devices-to-circuits simulation framework (FANTASI) for fast estimation of the write error rates (WER) in different spintronic devices and circuits. Here, we show that, FANTASI enables efficient spintronic device-circuit co-design, with results in good agreement with the experimental measurements.