Siva Satyendra Sahoo, T. D. A. Nguyen, B. Veeravalli, Akash Kumar
{"title":"基于qos感知的跨层可靠性集成fpga动态部分可重构系统分区","authors":"Siva Satyendra Sahoo, T. D. A. Nguyen, B. Veeravalli, Akash Kumar","doi":"10.1109/FPT.2018.00041","DOIUrl":null,"url":null,"abstract":"Dynamic Partial Reconfiguration (DPR) can be used for time-sharing of computing resources within Partially Reconfigurable Regions (PRRs) in FPGA-based systems. The heterogeneous partitioning in such systems allows the user to exploit the application-specific mapping of Partially Reconfigurable Modules (PRMs) to PRRs to implement more efficient designs. It offers increased opportunities in optimizing the reliability of the system across multiple layers - from the low-level physical one to the higher application layer. This method, called cross-layer reliability, can potentially exploit the application-specific tolerances to the quality of service (QoS) to tackle the increasing device fault-rates more cost-effectively by distributing the fault-mitigation to different layers. In this work, we propose a QoS-aware cross-layer reliability-integrated design methodology for FPGA-based DPR systems. Specifically, our methodology analyzes the requirements of the applications in terms of Functional Reliability, System Lifetime and Makespan to determine the best possible combinations of reliability-oriented design choices in different layers. We report up to an average of 24% and 30% performance improvements for single and multi-objective optimization-based system partitioning.","PeriodicalId":434541,"journal":{"name":"2018 International Conference on Field-Programmable Technology (FPT)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"QoS-Aware Cross-Layer Reliability-Integrated FPGA-Based Dynamic Partially Reconfigurable System Partitioning\",\"authors\":\"Siva Satyendra Sahoo, T. D. A. Nguyen, B. Veeravalli, Akash Kumar\",\"doi\":\"10.1109/FPT.2018.00041\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Dynamic Partial Reconfiguration (DPR) can be used for time-sharing of computing resources within Partially Reconfigurable Regions (PRRs) in FPGA-based systems. The heterogeneous partitioning in such systems allows the user to exploit the application-specific mapping of Partially Reconfigurable Modules (PRMs) to PRRs to implement more efficient designs. It offers increased opportunities in optimizing the reliability of the system across multiple layers - from the low-level physical one to the higher application layer. This method, called cross-layer reliability, can potentially exploit the application-specific tolerances to the quality of service (QoS) to tackle the increasing device fault-rates more cost-effectively by distributing the fault-mitigation to different layers. In this work, we propose a QoS-aware cross-layer reliability-integrated design methodology for FPGA-based DPR systems. Specifically, our methodology analyzes the requirements of the applications in terms of Functional Reliability, System Lifetime and Makespan to determine the best possible combinations of reliability-oriented design choices in different layers. We report up to an average of 24% and 30% performance improvements for single and multi-objective optimization-based system partitioning.\",\"PeriodicalId\":434541,\"journal\":{\"name\":\"2018 International Conference on Field-Programmable Technology (FPT)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International Conference on Field-Programmable Technology (FPT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FPT.2018.00041\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Conference on Field-Programmable Technology (FPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FPT.2018.00041","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
QoS-Aware Cross-Layer Reliability-Integrated FPGA-Based Dynamic Partially Reconfigurable System Partitioning
Dynamic Partial Reconfiguration (DPR) can be used for time-sharing of computing resources within Partially Reconfigurable Regions (PRRs) in FPGA-based systems. The heterogeneous partitioning in such systems allows the user to exploit the application-specific mapping of Partially Reconfigurable Modules (PRMs) to PRRs to implement more efficient designs. It offers increased opportunities in optimizing the reliability of the system across multiple layers - from the low-level physical one to the higher application layer. This method, called cross-layer reliability, can potentially exploit the application-specific tolerances to the quality of service (QoS) to tackle the increasing device fault-rates more cost-effectively by distributing the fault-mitigation to different layers. In this work, we propose a QoS-aware cross-layer reliability-integrated design methodology for FPGA-based DPR systems. Specifically, our methodology analyzes the requirements of the applications in terms of Functional Reliability, System Lifetime and Makespan to determine the best possible combinations of reliability-oriented design choices in different layers. We report up to an average of 24% and 30% performance improvements for single and multi-objective optimization-based system partitioning.