单极结晶体管作为抑制短沟道效应的新型双材料双栅MOSFET的分析研究

A. Basak, A. Sarkar
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引用次数: 0

摘要

提出了一种新的双材料双栅MOSFET的二维解析建模方法。在源端采用$\ mathm {N}+$区域,在漏极端和栅极端采用p区域,通过在漏极侧形成单极结,构建单极结结构,作为一种新型的双材料双栅MOSFET。在这里我们观察了结构的表面电位、电场分布、阈值电压、DIBL、亚阈值波动等不同的变化。利用抛物近似法对二维泊松方程进行了解析建模。对传统双栅MOSFET (CDG)、单极结单材料双栅MOSFET (UJ-SMG)和单极结双材料双栅MOSFET (UJ-DMDG)结构进行了比较研究。结果表明,与CDG和UJ-SMG MOSFET相比,UJ-DMDG结构具有更好的抑制短通道效应的效果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Analytical Study of Unipolar Junction Transistor as a Novel Dual Material Double Gate MOSFET to Suppress Short-Channel Effect
We propose a new 2D analytical modeling of dual material double gate MOSFET which worked as unipolar junction transistor. A region of $\mathrm{N}+$ on the source terminal and a P-region on the drain and gate terminals are used to construct the structure of unipolar junction as a novel dual material dual gate MOSFET by forming an unipolar junction at the drain side. Here we observed different variation such as surface potential of the structure, distribution of electric field, threshold voltage, DIBL, subthreshold swings. These observations are analytically modeled to solve 2D Poisson's equation by applying parabolic approximation method. A comparative study for conventional double gate MOSFET (CDG), Unipolar junction single material double gate MOSFET (UJ-SMG) and unipolar junction dual material double gate MOSFET (UJ-DMDG) structures has been observed. Results reveal that UJ-DMDG MOSFET structure provides better result to suppress the short channel effect as compared to CDG and UJ-SMG MOSFET.
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