用于介电特性估计的太赫兹三维合成孔径成像

2018 11th UK-Europe-China Workshop on Millimeter Waves and Terahertz Technologies (UCMMT) Pub Date : 2018-09-01 DOI:10.1109/UCMMT45316.2018.9015924

Chao Sun, Qinggong Chang, Yahai Wang, F. Nian

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引用次数: 0

摘要

在常规测试测量仪器的基础上，构建了220 ~ 235ghz太赫兹三维成像系统，工作在阶跃频率连续波下。在详细描述了测量设置后，利用距离偏移算法获得了两种材料的高分辨率三维图像。从三维图像数据的多个视图，然后估计被测材料的厚度和介电常数，提供提取材料介电特性的替代方案。

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Terahertz 3-D Synthetic Aperture Imaging for Dielectric Properties Estimation

A 220-235GHz terahertz three-dimensional imaging system is constructed based on general test and measurement instruments, operating in the stepped-frequency continuous wave. After a detailed description of the measurement setup, high-resolution three-dimensional images of two materials are obtained using range migration algorithm. From multiple views of the three dimensional image data, the thickness and permittivity of the measured materials are then estimated, providing an alternative of extracting material dielectric properties.

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2018 11th UK-Europe-China Workshop on Millimeter Waves and Terahertz Technologies (UCMMT)

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