{"title":"最新h和e值对新SI中电阻和电压可追溯性的预测影响(systemme international)","authors":"N. Fletcher, G. Rietveld, J. Olthoff, I. Budovsky","doi":"10.1109/CPEM.2014.6898444","DOIUrl":null,"url":null,"abstract":"This paper considers the impact of the planned redefinition of the SI on electrical traceability, with a focus on resistance and voltage calibration. The new SI will replace the 1990 values for the critical constants R<sub>K</sub> and K<sub>J</sub>. With the present state of experimental data, we can say with good confidence that the required relative changes will be of order the 2 × 10<sup>-8</sup> for R<sub>K</sub> and 10 × 10<sup>-8</sup> for K<sub>J</sub>. These changes will only be visible for a small number of top-level standards in NMIs and industry. Thus, no disruption in traceability is anticipated due to this change, and this paper is part of a communication campaign by the CCEM to ensure a smooth transition.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Predicted impact of latest h and e values on resistance and voltage traceability in the new SI (système international)\",\"authors\":\"N. Fletcher, G. Rietveld, J. Olthoff, I. Budovsky\",\"doi\":\"10.1109/CPEM.2014.6898444\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper considers the impact of the planned redefinition of the SI on electrical traceability, with a focus on resistance and voltage calibration. The new SI will replace the 1990 values for the critical constants R<sub>K</sub> and K<sub>J</sub>. With the present state of experimental data, we can say with good confidence that the required relative changes will be of order the 2 × 10<sup>-8</sup> for R<sub>K</sub> and 10 × 10<sup>-8</sup> for K<sub>J</sub>. These changes will only be visible for a small number of top-level standards in NMIs and industry. Thus, no disruption in traceability is anticipated due to this change, and this paper is part of a communication campaign by the CCEM to ensure a smooth transition.\",\"PeriodicalId\":256575,\"journal\":{\"name\":\"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.2014.6898444\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.2014.6898444","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Predicted impact of latest h and e values on resistance and voltage traceability in the new SI (système international)
This paper considers the impact of the planned redefinition of the SI on electrical traceability, with a focus on resistance and voltage calibration. The new SI will replace the 1990 values for the critical constants RK and KJ. With the present state of experimental data, we can say with good confidence that the required relative changes will be of order the 2 × 10-8 for RK and 10 × 10-8 for KJ. These changes will only be visible for a small number of top-level standards in NMIs and industry. Thus, no disruption in traceability is anticipated due to this change, and this paper is part of a communication campaign by the CCEM to ensure a smooth transition.
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