两个同时工作并串联的真空电弧所发射离子的电荷和速度分布

G. Shafir, S. Goldsmith, E. Cheifetz
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摘要

利用动态飞行时间诊断技术测量了两个紧凑、串联、同时工作的真空电弧发射的等离子体束中银离子的离子速度分布(IVD)和离子荷态分布(ICSD)。每条电弧的阳极和阴极是由粘贴在氧化铝晶片上的两条银层制成的,中间有一个狭窄的100微米的间隙。这两个弧在横向上相距0.015 m,位于同一水平面上,发射出两个等离子体,在距离弧几厘米处合并成一个等离子体。每个电弧由氧化铝表面间隙上3mus 100 A的高压击穿点燃。在距离电弧0.7 m处分析合并等离子体束的IVD,并与单个电弧发射离子的IVD进行比较。当单弧激活时,等离子体束中银离子占90%以上,平均速度为(0.7 ~ 0.8)次104m/s,电荷态z=1。大约10%的束流离子由氧和碳组成。当两个电弧同时作用时,IVD的形态有明显的不同,包含第二个峰,其速度=(1.15-1.25)乘以104m/s,明显高于单个电弧时的速度。然而,合并光束中的综合离子电荷比从每个电弧的等离子体中获得的离子电荷之和低30%。结果表明,所观察到的现象与在第一个串联电弧的阴极和第二个串联电弧的阳极之间形成导电通道有关,这是在两个串联电弧膨胀的等离子体柱合并时发生的。当在两个电弧之间插入物理屏障以防止两个膨胀的李子之间的接触时,观察到的等离子体分流并没有发生,尽管两束光束像以前一样在屏障之外的空间合并。电弧从第一阴极转移到第二电弧阳极对IVD的影响目前正在研究中。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Charge and velocity distribution of ions emitted from two simultaneously operating and serially connected vacuum arcs
Ion velocity distribution (IVD) and ion charge state distribution (ICSD) of silver ions in a plasma beam emitted by two compact, serially connected, and simultaneously operating vacuum arcs was measured using a dynamic time of flight diagnostics. The anode and cathode of each arc were made of two strips of silver layers pasted on an alumina wafer and separated by a narrow 100 mum gap. The two arcs were laterally separated by 0.015 m and located on the same horizontal plane, emitting two plasma plums, which merged into a single one few cm away from the arcs. Each arc was ignited by high voltage breakdown on the alumina surface gap by 3mus 100 A current. The IVD of the merged plasma beam was analyzed 0.7 m away from the arcs, and compared with that of the ions emitted by a single arc. When only a single arc was active, the plasma beam consisted of more than 90 % of Ag ions with average velocity = (0.7-0.8)times104m/s and charge state z=1. About 10% of the beam ion population consisted of oxygen and carbon. When the two arcs operated simultaneously, the form of the IVD was significantly different, containing a second peak with velocity of =(1.15-1.25)times104m/s, significantly higher than that observed with a single arc. However, the integrated ion charge in the merged beam was lower by 30% from the sum of the ion charge obtained from the plasma of each arc. It was found that the observed phenomena were correlated with a formation of conducting channel between the cathode of the first serially connected arc and the anode of the second arc, occurring when the plasma plums expanding from the two arcs merged. When a physical barrier was inserted between the two arcs to prevent a contact between the two expanding plums, the observed plasma shunting did not occur, although the two beams merged in space beyond the barrier, as before. The effect on the IVD due to arc transfer from the first cathode to the second arc anode is currently being investigated.
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