浮点单元的广泛测试

Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future Pub Date : 2000-09-05 DOI:10.1109/EURMIC.2000.874631

J. Sosnowski, T. Bech

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引用次数: 6

摘要

本文讨论了为IEEE-754和Intel x86兼容的浮点单元(fpu)开发测试程序的问题。穷举测试是由伪随机、故障和面向应用的指令序列的平衡混合保证的。使用了特殊的工具来管理测试监控和优化故障覆盖率。实验结果说明了它们的有用性。给出了与所开发测试的成本(时间和内存空间)相关的一些数据。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Extensive testing of floating point unit

This paper addresses the problem of developing test programs for IEEE-754 and Intel x87-compliant floating point units (FPUs). Exhaustive testing is assured by a balanced mixture of pseudorandom, fault and application-oriented instruction sequences. Special tools have been used to manage the test monitoring and to optimize the fault coverage. Their usefulness was illustrated with experimental results. Some data related to the cost (in time and RAM space) of the developed tests are presented.

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Proceedings of the 26th Euromicro Conference. EUROMICRO 2000. Informatics: Inventing the Future

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