一维集成电路在多重故障下的可测试性

M. Gala, K. Watson, D. Ross
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摘要

讨论了组合单元一维单边迭代逻辑阵列(ILAs)在多重故障条件下的测试。研究表明,在多个故障情况下,为具有主输出的ILAs生成测试集是可能的。一些ila具有与阵列大小无关的恒定数量的测试向量。这些类型的数组称为c可测试数组。目前的工作证明了所有有用的只有边界输出的一维单边ila在多个故障下都是不可c -可测试的
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Testability of one dimensional ILAs under multiple faults
Testing of one dimensional unilateral iterative logic arrays (ILAs) of combinational cells under multiple faults is discussed. It has been shown that it is possible to generate a test set for ILAs with primary outputs under multiple faults. Some ILAs have a constant number of test vectors independent of the size of the array. These types of arrays are called C-testable arrays. Present work proves that all useful one dimensional unilateral ILAs with only boundary outputs are not C-testable under multiple faults.<>
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