机器学习中基于sMRI表面形态特征的自闭症谱系障碍检测

M. Mishra, U. C. Pati
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引用次数: 3

摘要

在各种大脑疾病中,自闭症谱系障碍(ASD)是非常不同的。它通常发生在儿童很小的时候。即使是父母也很难识别孩子的异常,因为它出现得很早。本文介绍了利用T1加权结构磁共振成像(sMRI)的表面形态特征来检测ASD的机器学习方法。并比较了基于大脑左半球表面和右半球表面形态特征的机器学习模型的分类评价。这项工作利用决策树(DT)和随机森林(RF)进行学习和分类。分类评估验证了RF在区分对照组和ASD患者方面比DT有更好的表现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Autism Spectrum Disorder Detection using Surface Morphometric Feature of sMRI in Machine Learning
Among various brain disorders, Autism Spectrum Disorder (ASD) is very different of its kind. It generally occurs at a very early age of children. It becomes difficult for even parents to identify an abnormality in their child due to its early occurrence. This paper presents the machine learning approach for the detection of ASD using surface morphometric features of T1 weighted structural Magnetic Resonance Imaging (sMRI). It also compares the classification evaluation of the utilized machine learning models based on left hemispheric surface and right hemispheric surface morphometric features of the brain. This work utilizes the Decision Tree (DT) and Random Forest (RF) for learning and classification purposes. Classification evaluation validates the better performance of RF in comparison to DT towards the classification between the controls and patients suffering from ASD.
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