标准可测试性总线—一个应用程序示例

J. Turino
{"title":"标准可测试性总线—一个应用程序示例","authors":"J. Turino","doi":"10.1109/IMTC.1990.65961","DOIUrl":null,"url":null,"abstract":"An application of a standard testability bus to the design of a next-generation automatic test system is described. The target system that must be made testable consists of multiple printed circuit boards that can be functionally reconfigured at start-up time via downloading of specific operating parameters to the on-board RAM. The result of the application was the ability to meet the system-level testability specifications, while at the same time reducing the time and cost associated with design verification, logic and fault simulation, capital equipment cost for external ATE (automatic test equipment), and on-going factory and field testing and troubleshooting.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Standard testability bus-an applications example\",\"authors\":\"J. Turino\",\"doi\":\"10.1109/IMTC.1990.65961\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An application of a standard testability bus to the design of a next-generation automatic test system is described. The target system that must be made testable consists of multiple printed circuit boards that can be functionally reconfigured at start-up time via downloading of specific operating parameters to the on-board RAM. The result of the application was the ability to meet the system-level testability specifications, while at the same time reducing the time and cost associated with design verification, logic and fault simulation, capital equipment cost for external ATE (automatic test equipment), and on-going factory and field testing and troubleshooting.<<ETX>>\",\"PeriodicalId\":404761,\"journal\":{\"name\":\"7th IEEE Conference on Instrumentation and Measurement Technology\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-02-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"7th IEEE Conference on Instrumentation and Measurement Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1990.65961\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"7th IEEE Conference on Instrumentation and Measurement Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1990.65961","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

介绍了标准测试总线在下一代自动测试系统设计中的应用。目标系统必须是可测试的,它由多个印刷电路板组成,这些电路板可以在启动时通过下载特定的操作参数到板上RAM来重新配置功能。应用的结果是能够满足系统级可测试性规范,同时减少了与设计验证、逻辑和故障模拟相关的时间和成本,外部ATE(自动测试设备)的资本设备成本,以及正在进行的工厂和现场测试和故障排除
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Standard testability bus-an applications example
An application of a standard testability bus to the design of a next-generation automatic test system is described. The target system that must be made testable consists of multiple printed circuit boards that can be functionally reconfigured at start-up time via downloading of specific operating parameters to the on-board RAM. The result of the application was the ability to meet the system-level testability specifications, while at the same time reducing the time and cost associated with design verification, logic and fault simulation, capital equipment cost for external ATE (automatic test equipment), and on-going factory and field testing and troubleshooting.<>
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