用于LED检测的多焦点图像融合系统

Wang Bishen, Liu Honglin
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引用次数: 0

摘要

对于微型led芯片的检测,传统的检测微型led芯片的方法是通过显微镜进行人工观察,但由于景深的限制,图像中会出现模糊的区域。为了解决这一问题,提出了一种多焦点图像融合系统,通过融合不同焦点的图像来获得清晰的LED芯片图像。通过多焦点图像融合系统,解决了景深有限导致图像模糊的问题,融合后的数字图像易于观察和保存。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A Multi-focus Image Fusion System for LED Detection
For micro-LED chip detection, Traditional method to check micro-LED chip is to observe manually through the microscope, but there will be blurred areas in image due to the limited depth of field. To solve this problem, a multi-focus image fusion system is proposed to obtain a sharp image of LED chip by fusing images with different in focus. Through the multi-focus image fusion system, the problem of blurred image caused by limited depth of field is solved, and the fused digital image is easy to observe and save.
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