{"title":"高品质石英晶体振荡器的稳定性:更新","authors":"M. Bloch, J. Ho, C. S. Stone, A. Syed, F. Walls","doi":"10.1109/FREQ.1989.68839","DOIUrl":null,"url":null,"abstract":"Two specially modified low-level, high-quality 5 MHz oscillators were tested for spectral purity and stability at the National Institute of Standards and Technology. Using a third, high-quality, prior-technology oscillator for triangulation the individual phase-noise power spectral density of one of the oscillators was determined to be S/sub phi /(f)=-133 dB+or-2 dB below 1 rad/sup 2//Hz at a Fourier frequency of 1 Hz, while for the second oscillator it was -125 dB+or-2 dB at 1 Hz. Such oscillators can exhibit parts-in-10/sup 14/ flicker floor stability in high-precision quartz frequency-source applications. Extensive details of measurement methodology are given.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"22","resultStr":"{\"title\":\"Stability of high quality quartz crystal oscillators: an update\",\"authors\":\"M. Bloch, J. Ho, C. S. Stone, A. Syed, F. Walls\",\"doi\":\"10.1109/FREQ.1989.68839\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Two specially modified low-level, high-quality 5 MHz oscillators were tested for spectral purity and stability at the National Institute of Standards and Technology. Using a third, high-quality, prior-technology oscillator for triangulation the individual phase-noise power spectral density of one of the oscillators was determined to be S/sub phi /(f)=-133 dB+or-2 dB below 1 rad/sup 2//Hz at a Fourier frequency of 1 Hz, while for the second oscillator it was -125 dB+or-2 dB at 1 Hz. Such oscillators can exhibit parts-in-10/sup 14/ flicker floor stability in high-precision quartz frequency-source applications. Extensive details of measurement methodology are given.<<ETX>>\",\"PeriodicalId\":294361,\"journal\":{\"name\":\"Proceedings of the 43rd Annual Symposium on Frequency Control\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-05-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"22\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 43rd Annual Symposium on Frequency Control\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FREQ.1989.68839\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 43rd Annual Symposium on Frequency Control","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.1989.68839","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Stability of high quality quartz crystal oscillators: an update
Two specially modified low-level, high-quality 5 MHz oscillators were tested for spectral purity and stability at the National Institute of Standards and Technology. Using a third, high-quality, prior-technology oscillator for triangulation the individual phase-noise power spectral density of one of the oscillators was determined to be S/sub phi /(f)=-133 dB+or-2 dB below 1 rad/sup 2//Hz at a Fourier frequency of 1 Hz, while for the second oscillator it was -125 dB+or-2 dB at 1 Hz. Such oscillators can exhibit parts-in-10/sup 14/ flicker floor stability in high-precision quartz frequency-source applications. Extensive details of measurement methodology are given.<>
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
