{"title":"采用局部动态重构技术提高fpga实时嵌入式系统的可靠性","authors":"J. Nunes","doi":"10.1109/DSNW.2013.6615521","DOIUrl":null,"url":null,"abstract":"This paper explores advances in reconfiguration properties of SRAM-based FPGAs to improve the resilience of real-time embedded systems that use this technology. The effects of radiation on these devices are described and the applicability of the most used fault tolerance approaches is investigated. It finishes proposing a few improvements on these methodologies and discusses the roadmap to reach that goal, presenting the on-going and the future work.","PeriodicalId":377784,"journal":{"name":"2013 43rd Annual IEEE/IFIP Conference on Dependable Systems and Networks Workshop (DSN-W)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Improving the dependability of FPGA-based real-time embedded systems with partial dynamic reconfiguration\",\"authors\":\"J. Nunes\",\"doi\":\"10.1109/DSNW.2013.6615521\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper explores advances in reconfiguration properties of SRAM-based FPGAs to improve the resilience of real-time embedded systems that use this technology. The effects of radiation on these devices are described and the applicability of the most used fault tolerance approaches is investigated. It finishes proposing a few improvements on these methodologies and discusses the roadmap to reach that goal, presenting the on-going and the future work.\",\"PeriodicalId\":377784,\"journal\":{\"name\":\"2013 43rd Annual IEEE/IFIP Conference on Dependable Systems and Networks Workshop (DSN-W)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 43rd Annual IEEE/IFIP Conference on Dependable Systems and Networks Workshop (DSN-W)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DSNW.2013.6615521\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 43rd Annual IEEE/IFIP Conference on Dependable Systems and Networks Workshop (DSN-W)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DSNW.2013.6615521","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improving the dependability of FPGA-based real-time embedded systems with partial dynamic reconfiguration
This paper explores advances in reconfiguration properties of SRAM-based FPGAs to improve the resilience of real-time embedded systems that use this technology. The effects of radiation on these devices are described and the applicability of the most used fault tolerance approaches is investigated. It finishes proposing a few improvements on these methodologies and discusses the roadmap to reach that goal, presenting the on-going and the future work.