空间应用纳米管存储器

2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Pub Date : 2004-03-06 DOI:10.1109/AERO.2004.1368024

M. Lovellette, A. Campbell, H. Hughes, R.K. Lawerence, J. Ward, M. Meinhold, T.R. Bengtson, G.F. Carleton, B. Segal, T. Rueckes

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引用次数: 12

摘要

研究了纳米机电单壁碳纳米管(SWNT)记忆元件的辐射硬度特性。NRAM位暴露在100克、1毫和10毫的伽马辐射中。初步测试结果表明，NRAM是一种辐射极强的硬存储器。

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Nanotube memories for space applications

The radiation hardness characteristics of nano-electromechanical single-walled carbon nanotube (SWNT) memory elements has been studied. The NRAM bits have been exposed to 100 krad, 1 Mrad and 10 Mrad of gamma-radiation. Initial test results indicate that NRAM is an extremely radiation hard memory.

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2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720)

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