{"title":"故障界方法的新发展——可诊断条件及其在模拟系统中的应用","authors":"Shiliang Zhou, Zheng-Hui Lin","doi":"10.1109/CICCAS.1991.184396","DOIUrl":null,"url":null,"abstract":"The failure bound method for analog fault diagnosis is developed in this paper. The necessary and sufficient condition for diagnosability of a faulty set as an analytic condition is derived. Based on these conditions another form of pseudo circuit is created, so that the diagnosis process can be continued with insufficient test points. Furthermore, a graphical condition for the diagnosability of a faulty set is also presented. Finally, a diagnosis algorithm is proposed with an example.<<ETX>>","PeriodicalId":119051,"journal":{"name":"China., 1991 International Conference on Circuits and Systems","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A new development of failure bound method-diagnosable conditions with application for analog systems\",\"authors\":\"Shiliang Zhou, Zheng-Hui Lin\",\"doi\":\"10.1109/CICCAS.1991.184396\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The failure bound method for analog fault diagnosis is developed in this paper. The necessary and sufficient condition for diagnosability of a faulty set as an analytic condition is derived. Based on these conditions another form of pseudo circuit is created, so that the diagnosis process can be continued with insufficient test points. Furthermore, a graphical condition for the diagnosability of a faulty set is also presented. Finally, a diagnosis algorithm is proposed with an example.<<ETX>>\",\"PeriodicalId\":119051,\"journal\":{\"name\":\"China., 1991 International Conference on Circuits and Systems\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-06-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"China., 1991 International Conference on Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICCAS.1991.184396\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"China., 1991 International Conference on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICCAS.1991.184396","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new development of failure bound method-diagnosable conditions with application for analog systems
The failure bound method for analog fault diagnosis is developed in this paper. The necessary and sufficient condition for diagnosability of a faulty set as an analytic condition is derived. Based on these conditions another form of pseudo circuit is created, so that the diagnosis process can be continued with insufficient test points. Furthermore, a graphical condition for the diagnosability of a faulty set is also presented. Finally, a diagnosis algorithm is proposed with an example.<>