{"title":"综合TCAM测试方案:考虑物理布局，结合扫描测试和高速BIST设计的优化测试算法","authors":"Hsiang-Huang Wu, Jih-Nung Lee, Ming-Cheng Chiang, Po-Wei Liu, Chi-Feng Wu","doi":"10.1109/TEST.2009.5355536","DOIUrl":null,"url":null,"abstract":"Considering the physical layout, a comprehensive TCAM test scheme divides TCAM test into test for TCAM core and test for peripheral circuit. Besides, it schedules the existing test algorithms to develop an optimized test algorithm.","PeriodicalId":419063,"journal":{"name":"2009 International Test Conference","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"A comprehensive TCAM test scheme: An optimized test algorithm considering physical layout and combining scan test with at-speed BIST design\",\"authors\":\"Hsiang-Huang Wu, Jih-Nung Lee, Ming-Cheng Chiang, Po-Wei Liu, Chi-Feng Wu\",\"doi\":\"10.1109/TEST.2009.5355536\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Considering the physical layout, a comprehensive TCAM test scheme divides TCAM test into test for TCAM core and test for peripheral circuit. Besides, it schedules the existing test algorithms to develop an optimized test algorithm.\",\"PeriodicalId\":419063,\"journal\":{\"name\":\"2009 International Test Conference\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-12-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2009.5355536\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2009.5355536","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A comprehensive TCAM test scheme: An optimized test algorithm considering physical layout and combining scan test with at-speed BIST design
Considering the physical layout, a comprehensive TCAM test scheme divides TCAM test into test for TCAM core and test for peripheral circuit. Besides, it schedules the existing test algorithms to develop an optimized test algorithm.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
