使用化学镍/金的低成本倒装芯片和CSP的路线图

T. Oppert, E. Zakel, T. Teutsch
{"title":"使用化学镍/金的低成本倒装芯片和CSP的路线图","authors":"T. Oppert, E. Zakel, T. Teutsch","doi":"10.1109/IEMTIM.1998.704534","DOIUrl":null,"url":null,"abstract":"Flip chip (FC) technology is gaining an increased level of importance for a variety of applications based on flip chip on board or flip chip in package. The first driving force for the introduction of this technology was the need to achieve increased speed and performance along with higher I/O count. A breakthrough, however, will be the use of flip chip due to cost reduction. For this aim, it is essential to use low cost bumping techniques in combination with an SMT-compatible assembly method. The FC techniques presented in this paper are all based on an electroless Ni/Au bumping process which has been developed by TUB/IZM and implemented into production by Pac Tech. This paper shows a roadmap based on electroless nickel/gold bumping for all flip chip interconnection technologies currently used in industry. Also, the roadmap to future developments in the semiconductor industry based on 300 mm wafers and the use of new pad metallisations such as Cu is shown. The compatibility of electroless nickel bumping in particular with these new technologies to be implemented in wafer manufacturing in the next millenium shows that this key technology offers a roadmap to flip chip technology not only for products and wafer technologies in use at present but for next generation wafer technologies. This paper looks at electroless Ni as a basis for anisotropic conductive adhesive (ACF) flip chip assembly, for polymeric flip chip assembly (conductive adhesive) and for soldering and direct chip attach-type applications using different solder alloys.","PeriodicalId":260028,"journal":{"name":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"28","resultStr":"{\"title\":\"A roadmap to low cost flip chip and CSP using electroless Ni/Au\",\"authors\":\"T. Oppert, E. Zakel, T. Teutsch\",\"doi\":\"10.1109/IEMTIM.1998.704534\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Flip chip (FC) technology is gaining an increased level of importance for a variety of applications based on flip chip on board or flip chip in package. The first driving force for the introduction of this technology was the need to achieve increased speed and performance along with higher I/O count. A breakthrough, however, will be the use of flip chip due to cost reduction. For this aim, it is essential to use low cost bumping techniques in combination with an SMT-compatible assembly method. The FC techniques presented in this paper are all based on an electroless Ni/Au bumping process which has been developed by TUB/IZM and implemented into production by Pac Tech. This paper shows a roadmap based on electroless nickel/gold bumping for all flip chip interconnection technologies currently used in industry. Also, the roadmap to future developments in the semiconductor industry based on 300 mm wafers and the use of new pad metallisations such as Cu is shown. The compatibility of electroless nickel bumping in particular with these new technologies to be implemented in wafer manufacturing in the next millenium shows that this key technology offers a roadmap to flip chip technology not only for products and wafer technologies in use at present but for next generation wafer technologies. This paper looks at electroless Ni as a basis for anisotropic conductive adhesive (ACF) flip chip assembly, for polymeric flip chip assembly (conductive adhesive) and for soldering and direct chip attach-type applications using different solder alloys.\",\"PeriodicalId\":260028,\"journal\":{\"name\":\"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"28\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMTIM.1998.704534\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2nd 1998 IEMT/IMC Symposium (IEEE Cat. No.98EX225)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMTIM.1998.704534","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 28

摘要

对于基于板上倒装芯片或封装倒装芯片的各种应用,倒装芯片(FC)技术正变得越来越重要。引入该技术的第一个驱动力是需要实现更高的速度和性能以及更高的I/O计数。然而,由于成本降低,倒装芯片的使用将是一个突破。为了实现这一目标,必须将低成本的碰撞技术与smt兼容的组装方法相结合。本文介绍的FC技术都是基于化学镍/金碰撞工艺,该工艺由TUB/IZM开发,并由Pac Tech投入生产。本文展示了基于化学镍/金碰撞的路线图,适用于目前工业中使用的所有倒装芯片互连技术。此外,还展示了基于300毫米晶圆和使用铜等新型衬垫金属的半导体行业未来发展路线图。化学镍碰撞的兼容性,特别是与这些新技术将在下一个千年的晶圆制造中实施,表明这一关键技术不仅为目前使用的产品和晶圆技术提供了倒装技术的路线图,而且为下一代晶圆技术提供了路线图。本文着眼于化学镀镍作为各向异性导电胶(ACF)倒装芯片组装、聚合物倒装芯片组装(导电胶)以及使用不同焊料合金的焊接和直接芯片连接型应用的基础。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A roadmap to low cost flip chip and CSP using electroless Ni/Au
Flip chip (FC) technology is gaining an increased level of importance for a variety of applications based on flip chip on board or flip chip in package. The first driving force for the introduction of this technology was the need to achieve increased speed and performance along with higher I/O count. A breakthrough, however, will be the use of flip chip due to cost reduction. For this aim, it is essential to use low cost bumping techniques in combination with an SMT-compatible assembly method. The FC techniques presented in this paper are all based on an electroless Ni/Au bumping process which has been developed by TUB/IZM and implemented into production by Pac Tech. This paper shows a roadmap based on electroless nickel/gold bumping for all flip chip interconnection technologies currently used in industry. Also, the roadmap to future developments in the semiconductor industry based on 300 mm wafers and the use of new pad metallisations such as Cu is shown. The compatibility of electroless nickel bumping in particular with these new technologies to be implemented in wafer manufacturing in the next millenium shows that this key technology offers a roadmap to flip chip technology not only for products and wafer technologies in use at present but for next generation wafer technologies. This paper looks at electroless Ni as a basis for anisotropic conductive adhesive (ACF) flip chip assembly, for polymeric flip chip assembly (conductive adhesive) and for soldering and direct chip attach-type applications using different solder alloys.
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