M. Tsunekane, T. Takahashi, N. Yoshimori, M. Nakajima
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Fluorescence Imaging Technology for High-Power Laser Beam Profiling
Fluorescence imaging technology combined with a >2MW/cm2 damage threshold, fluorescent plate and a CMOS camera was developed for real-time 2D beam profiling of high-power lasers without any attenuators and any image reconstructions.
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