近红外等离子体光纤传感器用超薄h2注入钯涂层复介电常数的测定

Xuejun Zhang, T. Guo, J. Albert
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引用次数: 0

摘要

我们报告了7 nm厚的钯薄膜在1310 nm波长附近暴露于浓度为0 - 3%(体积)的氮中氢的复合介电常数的测量。测量是用倾斜的光纤布拉格光栅进行的,首先涂上30纳米的金,然后在3到43纳米之间的几种厚度上涂上钯。基于可测实验参数的光栅响应模拟表明,当钯的厚度在3 ~ 10 nm之间时,光栅透射率的测量变化与厚度无关。因此,对于7纳米厚的薄膜,透射率的任何变化都可以直接追溯到介电常数的变化。钯层介电常数的相对变化与氢浓度呈线性关系,在氢浓度为0 ~ 1.7%时,其比例因子为- 0.093/%H2。所使用的光栅配置的检测极限被确定为380 ppm,在平均超过80秒的测量标准偏差的三倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Determination of the complex permittivity of ultrathin H2-infused palladium coatings for plasmonic fiber optic sensors in the near infrared
We report measurements of the complex permittivity of 7 nm thick palladium thin films exposed to concentrations of 0 to 3 % (by volume) of hydrogen in nitrogen at wavelengths near 1310 nm. Measurements were carried out with a tilted fiber Bragg grating first coated with 30 nm of gold and then palladium at several thicknesses between 3 and 43 nm. Simulations of the grating response based on measurable experimental parameters indicate that for palladium thicknesses between 3 and 10 nm the measured changes in the grating transmission become independent of thickness. Therefore, for a 7 nm thick film any change in transmission can be traced directly to changes in permittivity. The relative change of the permittivity of the palladium layer was found to scale linearly with hydrogen concentration with a scaling factor of −0.093/%H2 for hydrogen concentrations between 0 and 1.7%. The limit of detection of the grating configuration used was determined to be 380 ppm at three times the standard deviation for measurements averaged over 80 seconds.
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