电压控制振荡器(VCO)设计中改进CMOS器件在辐射环境下的结构和电学性能

C. P. Jain
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引用次数: 2

摘要

本文介绍了带辐射和不带辐射的CMOS结构,以及不同辐射剂量下器件电性能的变化,并提出了一种改进的CMOS电路,通过改善I-V特性的开关点来减轻辐射影响。为了重新设计抗辐射电路;利用上述抗辐射逆变电路,采用抗辐射设计(RDBD)技术设计了压控振荡器。当辐照时,电路仅表现出最小的随总剂量的退化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Structural and electrical properties of modified CMOS device under radiation environment in designing of voltage control oscillator (VCO)
This paper shows the structural CMOS with and without radiation and variation of electrical properties of device under various radiations doses and proposes a modified CMOS circuit which mitigates radiation effect by improving switch point in I-V characteristic. In order to redesign the circuit for radiation resistance; the above radiation hardened inverter circuit is used to design the Voltage Controlled Oscillator using Radiation Hardened By Design (RDBD) technique. The circuit exhibits only minimal degradation with total dose when irradiated.
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