{"title":"加速温度-湿度条件下钝化和未钝化al - ptag导线键的腐蚀特性","authors":"S. Khadpe","doi":"10.1109/EIC.1977.7461914","DOIUrl":null,"url":null,"abstract":"This paper describes the effects of an 85°C/ 85% RH environment on the bond strength of passivated and unpassivated aluminum wire bonds in contact with thick film platinum-silver metallization in a non-hermetic package. An RTV silicone junction coating material and a ceramic cover coated with a single component epoxy resin powder were used singly and in combination to protect the wire bonds. Test samples were exposed to the 85°C/85%RH environment for a total period of 168 hours. Bonds were destructively pull tested at the end of 24, 96 and 168 hours. Selected samples were also examined with an optical microscope and a scanning electron microscope (SEM). It was observed that the unencapsulated wire bonds suffered extensive galvanic corrosion at the Al-to-PtAg interface after 24 hours of exposure. The encapsulated bonds had no visible corrosion at the bond sites and retained more than 80% of the initial bond strength even after 168 hours of exposure.","PeriodicalId":214025,"journal":{"name":"1977 EIC 13th Electrical/Electronics Insulation Conference","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1977-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Corrosion characteristics of passivated and unpassivated Al-to-PtAg wire bonds under accelerated temperature — Humidity conditions\",\"authors\":\"S. Khadpe\",\"doi\":\"10.1109/EIC.1977.7461914\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the effects of an 85°C/ 85% RH environment on the bond strength of passivated and unpassivated aluminum wire bonds in contact with thick film platinum-silver metallization in a non-hermetic package. An RTV silicone junction coating material and a ceramic cover coated with a single component epoxy resin powder were used singly and in combination to protect the wire bonds. Test samples were exposed to the 85°C/85%RH environment for a total period of 168 hours. Bonds were destructively pull tested at the end of 24, 96 and 168 hours. Selected samples were also examined with an optical microscope and a scanning electron microscope (SEM). It was observed that the unencapsulated wire bonds suffered extensive galvanic corrosion at the Al-to-PtAg interface after 24 hours of exposure. The encapsulated bonds had no visible corrosion at the bond sites and retained more than 80% of the initial bond strength even after 168 hours of exposure.\",\"PeriodicalId\":214025,\"journal\":{\"name\":\"1977 EIC 13th Electrical/Electronics Insulation Conference\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1977-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1977 EIC 13th Electrical/Electronics Insulation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EIC.1977.7461914\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1977 EIC 13th Electrical/Electronics Insulation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EIC.1977.7461914","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Corrosion characteristics of passivated and unpassivated Al-to-PtAg wire bonds under accelerated temperature — Humidity conditions
This paper describes the effects of an 85°C/ 85% RH environment on the bond strength of passivated and unpassivated aluminum wire bonds in contact with thick film platinum-silver metallization in a non-hermetic package. An RTV silicone junction coating material and a ceramic cover coated with a single component epoxy resin powder were used singly and in combination to protect the wire bonds. Test samples were exposed to the 85°C/85%RH environment for a total period of 168 hours. Bonds were destructively pull tested at the end of 24, 96 and 168 hours. Selected samples were also examined with an optical microscope and a scanning electron microscope (SEM). It was observed that the unencapsulated wire bonds suffered extensive galvanic corrosion at the Al-to-PtAg interface after 24 hours of exposure. The encapsulated bonds had no visible corrosion at the bond sites and retained more than 80% of the initial bond strength even after 168 hours of exposure.