{"title":"微波s参数数据低频外推提取HBT高频等效网络参数","authors":"E. John, M. B. Das, Li-wu Yang, S. Liu","doi":"10.1109/CORNEL.1993.303079","DOIUrl":null,"url":null,"abstract":"This paper reports a comprehensive low-frequency extrapolation method for the purpose of separating the intrinsic and extrinsic or parasitic equivalent network parameters of high-frequency HBT's. The method involves measurements of the device's small-signal parameters over a wide frequency range, and low-frequency extrapolation (LFE) of various transformed two-port parameters using a range of collector bias currents. For the extraction of the equivalent network parameters, the measured S-parameters are first converted into y- and h-parameters and they are used directly or in composite fashions in order to extract the parasitic series resistance elements (r/sub bb'/, and r/sub ee'/), the shunt capacitance elements (c/sub j/e, c/sub bc/ and c/sub c/), and the intrinsic emitter-to-collector transit time after allowing for the parasitic time constant effects.<<ETX>>","PeriodicalId":129440,"journal":{"name":"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits","volume":"62 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Extraction of high-frequency equivalent network parameters of HBT's by low-frequency extrapolation of microwave S-parameter data\",\"authors\":\"E. John, M. B. Das, Li-wu Yang, S. Liu\",\"doi\":\"10.1109/CORNEL.1993.303079\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper reports a comprehensive low-frequency extrapolation method for the purpose of separating the intrinsic and extrinsic or parasitic equivalent network parameters of high-frequency HBT's. The method involves measurements of the device's small-signal parameters over a wide frequency range, and low-frequency extrapolation (LFE) of various transformed two-port parameters using a range of collector bias currents. For the extraction of the equivalent network parameters, the measured S-parameters are first converted into y- and h-parameters and they are used directly or in composite fashions in order to extract the parasitic series resistance elements (r/sub bb'/, and r/sub ee'/), the shunt capacitance elements (c/sub j/e, c/sub bc/ and c/sub c/), and the intrinsic emitter-to-collector transit time after allowing for the parasitic time constant effects.<<ETX>>\",\"PeriodicalId\":129440,\"journal\":{\"name\":\"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits\",\"volume\":\"62 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-08-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CORNEL.1993.303079\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CORNEL.1993.303079","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Extraction of high-frequency equivalent network parameters of HBT's by low-frequency extrapolation of microwave S-parameter data
This paper reports a comprehensive low-frequency extrapolation method for the purpose of separating the intrinsic and extrinsic or parasitic equivalent network parameters of high-frequency HBT's. The method involves measurements of the device's small-signal parameters over a wide frequency range, and low-frequency extrapolation (LFE) of various transformed two-port parameters using a range of collector bias currents. For the extraction of the equivalent network parameters, the measured S-parameters are first converted into y- and h-parameters and they are used directly or in composite fashions in order to extract the parasitic series resistance elements (r/sub bb'/, and r/sub ee'/), the shunt capacitance elements (c/sub j/e, c/sub bc/ and c/sub c/), and the intrinsic emitter-to-collector transit time after allowing for the parasitic time constant effects.<>