{"title":"对组件服从指数分布的串联系统的可靠性综合验收试验计划","authors":"Xuejing Li, Dan Yu","doi":"10.1109/ISI.2011.5984110","DOIUrl":null,"url":null,"abstract":"For the series systems whose components follow the exponential distribution, we put forward the reliability integrated acceptance test plan based on the components' information. Finally, we will provide a simulation example to demonstrate our method.","PeriodicalId":220165,"journal":{"name":"Proceedings of 2011 IEEE International Conference on Intelligence and Security Informatics","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A reliability integrated acceptance test plan for series systems whose components following exponential distributions\",\"authors\":\"Xuejing Li, Dan Yu\",\"doi\":\"10.1109/ISI.2011.5984110\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For the series systems whose components follow the exponential distribution, we put forward the reliability integrated acceptance test plan based on the components' information. Finally, we will provide a simulation example to demonstrate our method.\",\"PeriodicalId\":220165,\"journal\":{\"name\":\"Proceedings of 2011 IEEE International Conference on Intelligence and Security Informatics\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 2011 IEEE International Conference on Intelligence and Security Informatics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISI.2011.5984110\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 2011 IEEE International Conference on Intelligence and Security Informatics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISI.2011.5984110","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A reliability integrated acceptance test plan for series systems whose components following exponential distributions
For the series systems whose components follow the exponential distribution, we put forward the reliability integrated acceptance test plan based on the components' information. Finally, we will provide a simulation example to demonstrate our method.