{"title":"规格覆盖辅助测试选择","authors":"Tuomo Pyhälä, Keijo Heljanko","doi":"10.1109/CSD.2003.1207713","DOIUrl":null,"url":null,"abstract":"Here, we consider test selection strategies in formal conformance testing. As the testing conformance relation we use the ioco relation, and extend the previously presented on-the-fly test generation algorithms for ioco to include test selection heuristic based on a specification coverage metric. The proposed method combines a greedy test selection with randomization to guarantee completeness. As a novel implementation technique we employ bounded model checking for lookahead in greedy test selection.","PeriodicalId":228530,"journal":{"name":"Third International Conference on Application of Concurrency to System Design, 2003. Proceedings.","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-06-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"Specification coverage aided test selection\",\"authors\":\"Tuomo Pyhälä, Keijo Heljanko\",\"doi\":\"10.1109/CSD.2003.1207713\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Here, we consider test selection strategies in formal conformance testing. As the testing conformance relation we use the ioco relation, and extend the previously presented on-the-fly test generation algorithms for ioco to include test selection heuristic based on a specification coverage metric. The proposed method combines a greedy test selection with randomization to guarantee completeness. As a novel implementation technique we employ bounded model checking for lookahead in greedy test selection.\",\"PeriodicalId\":228530,\"journal\":{\"name\":\"Third International Conference on Application of Concurrency to System Design, 2003. Proceedings.\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-06-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Third International Conference on Application of Concurrency to System Design, 2003. Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSD.2003.1207713\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third International Conference on Application of Concurrency to System Design, 2003. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSD.2003.1207713","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Here, we consider test selection strategies in formal conformance testing. As the testing conformance relation we use the ioco relation, and extend the previously presented on-the-fly test generation algorithms for ioco to include test selection heuristic based on a specification coverage metric. The proposed method combines a greedy test selection with randomization to guarantee completeness. As a novel implementation technique we employ bounded model checking for lookahead in greedy test selection.