{"title":"用STM/AFM研究可擦光盘薄膜的微观结构","authors":"Zhanghua Wu, F. Gan","doi":"10.1117/12.150649","DOIUrl":null,"url":null,"abstract":"The microstructure of sputtered amorphous magneto-optic media TbFeCo is observed by self- designed scanning tunneling microscopy (STM), and tracks in phase-change media are recorded. GeSbTe is also investigated by atomic force microscopy.","PeriodicalId":212484,"journal":{"name":"Optical Storage and Information Data Storage","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microstructure of erasable optic disk thin film investigated by STM/AFM\",\"authors\":\"Zhanghua Wu, F. Gan\",\"doi\":\"10.1117/12.150649\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The microstructure of sputtered amorphous magneto-optic media TbFeCo is observed by self- designed scanning tunneling microscopy (STM), and tracks in phase-change media are recorded. GeSbTe is also investigated by atomic force microscopy.\",\"PeriodicalId\":212484,\"journal\":{\"name\":\"Optical Storage and Information Data Storage\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-08-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Storage and Information Data Storage\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.150649\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Storage and Information Data Storage","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.150649","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Microstructure of erasable optic disk thin film investigated by STM/AFM
The microstructure of sputtered amorphous magneto-optic media TbFeCo is observed by self- designed scanning tunneling microscopy (STM), and tracks in phase-change media are recorded. GeSbTe is also investigated by atomic force microscopy.
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