{"title":"快速宽带电池阻抗测量的高分辨率系统","authors":"Bryce E. Hill, J. Christophersen, J. Morrison","doi":"10.1109/AERO53065.2022.9843582","DOIUrl":null,"url":null,"abstract":"Inline Rapid Impedance Spectroscopy (iRIS) is a method of quickly measuring impedance measurements over a broad range of simultaneous frequencies. Montana Technological University (MTech) has been sponsored by Dynexus Technology to enhance the iRIS system capabilities, including an improvement in the overall measurement resolution. The baseline iRIS system has a stated resolution of $\\pm 0.01\\mathrm{m}\\Omega$ and a previously-developed resolution enhancement kit demonstrated an improvement down to $\\pm 0.01\\mathrm{m}\\Omega$. Continued research with the enhancement kit has shown that the iRIS system can potentially achieve resolutions better than $\\pm 5\\ \\mu \\Omega$. An overview of this new approach along with measurement results that demonstrate very high resolution is presented.","PeriodicalId":219988,"journal":{"name":"2022 IEEE Aerospace Conference (AERO)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-03-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High Resolution System for Rapid Broadband Battery Impedance Measurements\",\"authors\":\"Bryce E. Hill, J. Christophersen, J. Morrison\",\"doi\":\"10.1109/AERO53065.2022.9843582\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Inline Rapid Impedance Spectroscopy (iRIS) is a method of quickly measuring impedance measurements over a broad range of simultaneous frequencies. Montana Technological University (MTech) has been sponsored by Dynexus Technology to enhance the iRIS system capabilities, including an improvement in the overall measurement resolution. The baseline iRIS system has a stated resolution of $\\\\pm 0.01\\\\mathrm{m}\\\\Omega$ and a previously-developed resolution enhancement kit demonstrated an improvement down to $\\\\pm 0.01\\\\mathrm{m}\\\\Omega$. Continued research with the enhancement kit has shown that the iRIS system can potentially achieve resolutions better than $\\\\pm 5\\\\ \\\\mu \\\\Omega$. An overview of this new approach along with measurement results that demonstrate very high resolution is presented.\",\"PeriodicalId\":219988,\"journal\":{\"name\":\"2022 IEEE Aerospace Conference (AERO)\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-03-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE Aerospace Conference (AERO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AERO53065.2022.9843582\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE Aerospace Conference (AERO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AERO53065.2022.9843582","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High Resolution System for Rapid Broadband Battery Impedance Measurements
Inline Rapid Impedance Spectroscopy (iRIS) is a method of quickly measuring impedance measurements over a broad range of simultaneous frequencies. Montana Technological University (MTech) has been sponsored by Dynexus Technology to enhance the iRIS system capabilities, including an improvement in the overall measurement resolution. The baseline iRIS system has a stated resolution of $\pm 0.01\mathrm{m}\Omega$ and a previously-developed resolution enhancement kit demonstrated an improvement down to $\pm 0.01\mathrm{m}\Omega$. Continued research with the enhancement kit has shown that the iRIS system can potentially achieve resolutions better than $\pm 5\ \mu \Omega$. An overview of this new approach along with measurement results that demonstrate very high resolution is presented.