1.3和1.55 μm (Al)InGaAs变质量子阱激光器的理论与优化

C. Broderick, Silviu Bogusevschi, E. O’Reilly
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引用次数: 0

摘要

利用InGaAs变质缓冲层(MBLs)促进晶格错配异质结构的生长,是在GaAs衬底上开发长波半导体激光器的一种有吸引力的方法,因为它们提供了与GaAs基材料相关的改进的载流子和光约束。本文从理论上研究了在InGaAs MBLs上生长的基于1.3和1.55 μm (Al)InGaAs量子阱(QW)激光器。我们证明了优化后的1.3 μm变质器件具有低阈值电流密度和高差分增益,与基于inp的器件相比具有优势。总的来说,我们的分析强调并量化了变质量子阱在gaas基长波长半导体激光器发展中的潜力,并为优化器件的设计提供了指导。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Theory and optimisation of 1.3 and 1.55 μm (Al)InGaAs metamorphic quantum well lasers
The use of InGaAs metamorphic buffer layers (MBLs) to facilitate the growth of lattice-mismatched heterostructures constitutes an attractive approach to developing long-wavelength semiconductor lasers on GaAs substrates, since they offer the improved carrier and optical confinement associated with GaAs-based materials. We present a theoretical study of GaAs-based 1.3 and 1.55 μm (Al)InGaAs quantum well (QW) lasers grown on InGaAs MBLs. We demonstrate that optimised 1.3 μm metamorphic devices offer low threshold current densities and high differential gain, which compare favourably with InP-based devices. Overall, our analysis highlights and quantifies the potential of metamorphic QWs for the development of GaAs-based long-wavelength semiconductor lasers, and also provides guidelines for the design of optimised devices.
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