{"title":"基于监督学习和图像绘制的村村检测","authors":"Chia-Yu Lin, Tzu-Min Chang, Hao-Yuan Chen, Tzer-jen Wei","doi":"10.1109/ICMEW59549.2023.00096","DOIUrl":null,"url":null,"abstract":"Mura refers to surface defects or areas of uneven brightness that can occur during factory panel production. Mura can vary in size and shape and be categorized as “light Mura” or “serious Mura.” To optimize the repair process, factories aim to differentiate between the two types of Mura before sending the panels for repair. However, current Mura detection models focus only on identifying “nrmal” and “Mura,” resulting in poor performance in distinguishing between light and serious Mura. To address this issue, we propose an ensemble approach called the Ensemble Image Inpainting and Supervised Modeling Mura Detection System (EISMDS), which combines supervised and image inpainting models to differentiate between the two types of Mura. Experimental results show that our approach improves the True Positive Rate (TPR) by 11 % under a high True Negative Rate (TNR) compared to a single supervised detection model.","PeriodicalId":111482,"journal":{"name":"2023 IEEE International Conference on Multimedia and Expo Workshops (ICMEW)","volume":"72 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An Ensemble of Supervised Learning and Image Inpainting for Mura Detection\",\"authors\":\"Chia-Yu Lin, Tzu-Min Chang, Hao-Yuan Chen, Tzer-jen Wei\",\"doi\":\"10.1109/ICMEW59549.2023.00096\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Mura refers to surface defects or areas of uneven brightness that can occur during factory panel production. Mura can vary in size and shape and be categorized as “light Mura” or “serious Mura.” To optimize the repair process, factories aim to differentiate between the two types of Mura before sending the panels for repair. However, current Mura detection models focus only on identifying “nrmal” and “Mura,” resulting in poor performance in distinguishing between light and serious Mura. To address this issue, we propose an ensemble approach called the Ensemble Image Inpainting and Supervised Modeling Mura Detection System (EISMDS), which combines supervised and image inpainting models to differentiate between the two types of Mura. Experimental results show that our approach improves the True Positive Rate (TPR) by 11 % under a high True Negative Rate (TNR) compared to a single supervised detection model.\",\"PeriodicalId\":111482,\"journal\":{\"name\":\"2023 IEEE International Conference on Multimedia and Expo Workshops (ICMEW)\",\"volume\":\"72 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 IEEE International Conference on Multimedia and Expo Workshops (ICMEW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMEW59549.2023.00096\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE International Conference on Multimedia and Expo Workshops (ICMEW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMEW59549.2023.00096","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Ensemble of Supervised Learning and Image Inpainting for Mura Detection
Mura refers to surface defects or areas of uneven brightness that can occur during factory panel production. Mura can vary in size and shape and be categorized as “light Mura” or “serious Mura.” To optimize the repair process, factories aim to differentiate between the two types of Mura before sending the panels for repair. However, current Mura detection models focus only on identifying “nrmal” and “Mura,” resulting in poor performance in distinguishing between light and serious Mura. To address this issue, we propose an ensemble approach called the Ensemble Image Inpainting and Supervised Modeling Mura Detection System (EISMDS), which combines supervised and image inpainting models to differentiate between the two types of Mura. Experimental results show that our approach improves the True Positive Rate (TPR) by 11 % under a high True Negative Rate (TNR) compared to a single supervised detection model.