{"title":"微波频率下微电脑控制的水分/介电常数测量","authors":"C. Akyel, R. Bosisio","doi":"10.1109/CPEM.1988.671302","DOIUrl":null,"url":null,"abstract":"A microwave system using close-loop technics measures simultaneously the weight and the complex dielectric constant of sample materials heated by strong electric RF fields inside a resonant cavity. The uses of a micro-computer permits to relate, in real time, the moisture content of sample materials exposed to RF fields to the dynamic changes observed in the complex dielectric constant at the test frequency [1].","PeriodicalId":326579,"journal":{"name":"1988 Conference on Precision Electromagnetic Measurements","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Micro-Computer Controlled Moisture/Permittivity Measurements in Microwave Frequencies\",\"authors\":\"C. Akyel, R. Bosisio\",\"doi\":\"10.1109/CPEM.1988.671302\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A microwave system using close-loop technics measures simultaneously the weight and the complex dielectric constant of sample materials heated by strong electric RF fields inside a resonant cavity. The uses of a micro-computer permits to relate, in real time, the moisture content of sample materials exposed to RF fields to the dynamic changes observed in the complex dielectric constant at the test frequency [1].\",\"PeriodicalId\":326579,\"journal\":{\"name\":\"1988 Conference on Precision Electromagnetic Measurements\",\"volume\":\"23 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1988 Conference on Precision Electromagnetic Measurements\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CPEM.1988.671302\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988 Conference on Precision Electromagnetic Measurements","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CPEM.1988.671302","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Micro-Computer Controlled Moisture/Permittivity Measurements in Microwave Frequencies
A microwave system using close-loop technics measures simultaneously the weight and the complex dielectric constant of sample materials heated by strong electric RF fields inside a resonant cavity. The uses of a micro-computer permits to relate, in real time, the moisture content of sample materials exposed to RF fields to the dynamic changes observed in the complex dielectric constant at the test frequency [1].
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
