Takahiro Nagase, Takuma Mori, H. Miyake, Y. Tanaka
{"title":"直流高应力下乙烯-四氟乙烯共聚物的空间电荷积累特性","authors":"Takahiro Nagase, Takuma Mori, H. Miyake, Y. Tanaka","doi":"10.1109/CEIDP.2015.7352011","DOIUrl":null,"url":null,"abstract":"Irradiating an electron beam to the ETFE, it is thought that electron-hole pairs are generated inside the sample. However, there is no reported cases about this problem. Therefore, by using a blocking layer to block the charge injection from the outside, an inside of an irradiated sample electron-hole pairs were investigated whether it is produced in the DC stress.","PeriodicalId":432404,"journal":{"name":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Space charge accumulation characteristics in ethylene-tetrafluoroethylene copolymer under DC high stress\",\"authors\":\"Takahiro Nagase, Takuma Mori, H. Miyake, Y. Tanaka\",\"doi\":\"10.1109/CEIDP.2015.7352011\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Irradiating an electron beam to the ETFE, it is thought that electron-hole pairs are generated inside the sample. However, there is no reported cases about this problem. Therefore, by using a blocking layer to block the charge injection from the outside, an inside of an irradiated sample electron-hole pairs were investigated whether it is produced in the DC stress.\",\"PeriodicalId\":432404,\"journal\":{\"name\":\"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.2015.7352011\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.2015.7352011","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Space charge accumulation characteristics in ethylene-tetrafluoroethylene copolymer under DC high stress
Irradiating an electron beam to the ETFE, it is thought that electron-hole pairs are generated inside the sample. However, there is no reported cases about this problem. Therefore, by using a blocking layer to block the charge injection from the outside, an inside of an irradiated sample electron-hole pairs were investigated whether it is produced in the DC stress.