数据缓存的系统级漏洞评估

Alireza Haghdoost, H. Asadi, A. Baniasadi
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引用次数: 13

摘要

在过去的几年中,辐射引起的瞬态错误,也称为软错误,已经严重威胁到高端和主流处理器的数据完整性。最近的研究表明,高速缓存存储器是高性能处理器中最容易出现软错误的组件之一。对漏洞因子(VF)的精确建模是开发具有成本效益的高速缓存保护技术的必要步骤。尽管故障注入(FI)技术可以提供相对准确的VF估计,但它们通常非常耗时。为了克服这一限制,最近提出了分析模型来及时计算缓存VF。在本文中,我们扩展了以前的工作,并提出了一种替代的分析模型来计算系统级漏洞因子(SVF),用于write-through和write-back数据缓存。在我们提出的分析模型中,我们同时考虑了读取频率和错误掩蔽来计算数据缓存的系统级漏洞。以前建议的建模技术忽略了读取频率和错误屏蔽的问题,主要关注错误可能在系统中传播的时间段。在这项工作中,我们表明忽略这两个参数会显著影响数据缓存的系统级VFs。我们报告了我们对SPEC ' 2K基准的估计,并与先前建议的模型进行了比较。我们的实验结果表明,所提出的建模技术改变了以前的VF估计高达40%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
System-Level Vulnerability Estimation for Data Caches
Over the past few years, radiation-induced transient errors, also referred to as soft errors, have been a severe threat to the data integrity of high-end and mainstream processors. Recent studies show that cache memories are among the most vulnerable components to soft errors within high-performance processors. Accurate modeling of the Vulnerability Factor (VF) is an essential step towards developing cost-effective protection techniques for cache memory. Although Fault Injection (FI) techniques can provide relatively accurate VF estimations they are often very time consuming. To overcome the limitation, recent analytical models were proposed to compute the cache VF in a timely fashion. In this paper, we extend previous work and propose an alternative analytical model to compute System-level Vulnerability Factor (SVF) for both write-through and write-back data caches. In our proposed analytical model, we take into account both read frequency and error masking to compute system-level vulnerability of data cache. Previously suggested modeling techniques overlook the issues of read frequency and error masking, mainly focusing on time periods in which an error could propagate in the system. In this work we show that overlooking these two parameters can significantly impact the system-level VFs for data caches. We report our estimations for SPEC’2K benchmarks and compare to previously suggested models. Our experimental results show that the proposed modeling technique changes previous VF estimations by up to 40%.
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