单壁和多壁碳纳米管的主峰和噪声的x射线衍射分析

Eman J. Theyab, Muhammed N. Muhammed, Firas H. Abdulrazzak, Aseel M. Ajobree, Zena M. Jassem, Israa M. Radhi, Samira Mammadova, Kalid T. Abdullah, Kalida Ali, Ahmed A. Ismail, Tariq H. Al Mgheer, Ahmed M. Abass, Ayad F. Alkaim, Takialdin A. Himdan, Falah H. Hussein
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引用次数: 0

摘要

碳纳米管的XRD在2Ө≈25°和43°处显示出两个主要的峰,并且在5到80°的所有线上有许多噪声,这取决于结构的性质。由仪器源和管状结构的物理性质产生的噪声,由内部和内部范德华力表示。大多数噪声都是通过计算机程序消除的,而它是指由一层或多层石墨烯构成的管状结构的性质。这些噪音大多代表了结构的性质,随着石墨烯片的增加而减少,因此去除它们会删除碳纳米管的特定特性。石墨具有管状结构的相同性质,但随片数的变化而变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
X-ray diffraction analysis for main peaks and the noises of single and multi-walled carbon nanotubes
The XRD for carbon nanotubes shows the main two peaks at 2Ө ≈ 25∘ and 43∘ with many noises for all the line from 5∘ to 80∘ which depend on nature of structure. The noises produce from instrumental sources and the physical properties of tubular structure and that represent by inter and intra Van Der Waals forces. Most of the noises were removed by using computerized programs while it is referred to nature of tubular structure with one or many sheets of graphene. The most of this noises represent the nature of structure which reduces with increase graphene sheets, thus removing it delete the specific proprieties of CNTs. The graphite behave the same properties of tubular structure which variant with number of sheets.
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