{"title":"$0.13\\ \\mu \\ mathm {m}$ SiGe BiCMOS技术的300 GHz四次谐波混频器","authors":"Chen Wang, Debin Hou, Jixin Chen, W. Hong","doi":"10.1109/RFIT.2018.8524040","DOIUrl":null,"url":null,"abstract":"A J-band wideband fourth-harmonically pumped mixer with low conversion loss using $0.13\\ {\\mu} \\mathbf{m}$ SiGe BiCMOS technology is reported. Compact equivalent anti-parallel-diode-pair (APDP) with minimized parasitic effect is investigated for conversion loss reduction. Driven by an external power amplifier with no less than 13 dBm LO power from 70 GHz to 85 GHz, the mixer exhibits measured up-conversion loss of 21–26 dB from 280 GHz to 325 GHz. Compared with other J-band mixers, this work achieves the lowest conversion loss with comparable IF bandwidth. The chip occupies $720\\ {\\mu}\\mathbf{m} \\times 380\\ \\mu\\mathrm{m}$ including the testing pads.","PeriodicalId":297122,"journal":{"name":"2018 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A 300 GHz 4th-Harmonic Mixer in $0.13\\\\ \\\\mu \\\\mathrm{m}$ SiGe BiCMOS Technology\",\"authors\":\"Chen Wang, Debin Hou, Jixin Chen, W. Hong\",\"doi\":\"10.1109/RFIT.2018.8524040\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A J-band wideband fourth-harmonically pumped mixer with low conversion loss using $0.13\\\\ {\\\\mu} \\\\mathbf{m}$ SiGe BiCMOS technology is reported. Compact equivalent anti-parallel-diode-pair (APDP) with minimized parasitic effect is investigated for conversion loss reduction. Driven by an external power amplifier with no less than 13 dBm LO power from 70 GHz to 85 GHz, the mixer exhibits measured up-conversion loss of 21–26 dB from 280 GHz to 325 GHz. Compared with other J-band mixers, this work achieves the lowest conversion loss with comparable IF bandwidth. The chip occupies $720\\\\ {\\\\mu}\\\\mathbf{m} \\\\times 380\\\\ \\\\mu\\\\mathrm{m}$ including the testing pads.\",\"PeriodicalId\":297122,\"journal\":{\"name\":\"2018 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)\",\"volume\":\"45 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RFIT.2018.8524040\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFIT.2018.8524040","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 300 GHz 4th-Harmonic Mixer in $0.13\ \mu \mathrm{m}$ SiGe BiCMOS Technology
A J-band wideband fourth-harmonically pumped mixer with low conversion loss using $0.13\ {\mu} \mathbf{m}$ SiGe BiCMOS technology is reported. Compact equivalent anti-parallel-diode-pair (APDP) with minimized parasitic effect is investigated for conversion loss reduction. Driven by an external power amplifier with no less than 13 dBm LO power from 70 GHz to 85 GHz, the mixer exhibits measured up-conversion loss of 21–26 dB from 280 GHz to 325 GHz. Compared with other J-band mixers, this work achieves the lowest conversion loss with comparable IF bandwidth. The chip occupies $720\ {\mu}\mathbf{m} \times 380\ \mu\mathrm{m}$ including the testing pads.