软件产品线基于模型的测试生成

2013 IEEE/ACIS 12th International Conference on Computer and Information Science (ICIS) Pub Date : 2013-06-16 DOI:10.1109/ICIS.2013.6607865

Xinying Cai, Hong-wei Zeng

{"title":"软件产品线基于模型的测试生成","authors":"Xinying Cai, Hong-wei Zeng","doi":"10.1109/ICIS.2013.6607865","DOIUrl":null,"url":null,"abstract":"Taking advantage of the reusability of domain engineering artifacts and variability description, SPLE reduces greatly development costs and time-to-market. This paper presents a model-based approach to test generation for SPLs. Reusable domain test scenarios are generated from activity diagrams extended with variation points, and then test scenarios for a specific application are derived by specifying and banding variants according to variation points.","PeriodicalId":345020,"journal":{"name":"2013 IEEE/ACIS 12th International Conference on Computer and Information Science (ICIS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Model-based test generation for software product line\",\"authors\":\"Xinying Cai, Hong-wei Zeng\",\"doi\":\"10.1109/ICIS.2013.6607865\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Taking advantage of the reusability of domain engineering artifacts and variability description, SPLE reduces greatly development costs and time-to-market. This paper presents a model-based approach to test generation for SPLs. Reusable domain test scenarios are generated from activity diagrams extended with variation points, and then test scenarios for a specific application are derived by specifying and banding variants according to variation points.\",\"PeriodicalId\":345020,\"journal\":{\"name\":\"2013 IEEE/ACIS 12th International Conference on Computer and Information Science (ICIS)\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-06-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE/ACIS 12th International Conference on Computer and Information Science (ICIS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIS.2013.6607865\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE/ACIS 12th International Conference on Computer and Information Science (ICIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIS.2013.6607865","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

利用领域工程工件的可重用性和可变性描述，SPLE大大降低了开发成本和上市时间。本文提出了一种基于模型的spc测试生成方法。可重用的领域测试场景是从带有变化点的活动图中生成的，然后通过根据变化点指定和标记变量来派生特定应用程序的测试场景。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Model-based test generation for software product line

Taking advantage of the reusability of domain engineering artifacts and variability description, SPLE reduces greatly development costs and time-to-market. This paper presents a model-based approach to test generation for SPLs. Reusable domain test scenarios are generated from activity diagrams extended with variation points, and then test scenarios for a specific application are derived by specifying and banding variants according to variation points.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2013 IEEE/ACIS 12th International Conference on Computer and Information Science (ICIS)

自引率

0.00%

发文量