嵌入式ASIC设计中直接存取测试方案的实现与验证

Third Annual IEEE Proceedings on ASIC Seminar and Exhibit Pub Date : 1990-09-17 DOI:10.1109/ASIC.1990.186177

V. Immaneni, D. Puffer, S. Raman

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引用次数: 1

摘要

讨论了直接存取测试方案(DATS)，该方案消除了设计者生成嵌入式块单元测试的负担。该方案提供了测试嵌入块细胞使用成熟的测试载体。讨论了DATS在ASIC设计中的实现和自动验证。

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Direct access test scheme-implementation and verification in embedded ASIC designs

The direct access test scheme (DATS) that eliminates the designer's burden of embedded block cell test generation is discussed. This scheme provides for testing of embedded block cells using proven test vectors. The implementation and automatic verification of DATS in ASIC designs is discussed.<>

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Third Annual IEEE Proceedings on ASIC Seminar and Exhibit

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