{"title":"用介电法测定磁丝与清漆相容性的新方法","authors":"Ge Zhengyan, Chen Daqian, Xu Gong","doi":"10.1109/ceidp.1987.7736549","DOIUrl":null,"url":null,"abstract":"This paper presents an experimental results which show that the regular pattern of chemical aging process of insulating materials under sealed heating condition can be monitored and characterized by dielectrometry or dielectric analysis with higher degree of sensitivity, efficiency and resolution in comparision with the usual method in which the compatibility is assessed by the drooping characteristic of breakdown voltage according to UL-1446 [1]. It is also found a prediction of new prospect that may be feasible to accelerate the aging test of an insulation system associated with functional factors by dielectrometry.","PeriodicalId":354533,"journal":{"name":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1986","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A new approach to compatibility of magnet wire and varnish using dielectrometry\",\"authors\":\"Ge Zhengyan, Chen Daqian, Xu Gong\",\"doi\":\"10.1109/ceidp.1987.7736549\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an experimental results which show that the regular pattern of chemical aging process of insulating materials under sealed heating condition can be monitored and characterized by dielectrometry or dielectric analysis with higher degree of sensitivity, efficiency and resolution in comparision with the usual method in which the compatibility is assessed by the drooping characteristic of breakdown voltage according to UL-1446 [1]. It is also found a prediction of new prospect that may be feasible to accelerate the aging test of an insulation system associated with functional factors by dielectrometry.\",\"PeriodicalId\":354533,\"journal\":{\"name\":\"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1986\",\"volume\":\"53 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1986\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ceidp.1987.7736549\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference on Electrical Insulation & Dielectric Phenomena — Annual Report 1986","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ceidp.1987.7736549","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new approach to compatibility of magnet wire and varnish using dielectrometry
This paper presents an experimental results which show that the regular pattern of chemical aging process of insulating materials under sealed heating condition can be monitored and characterized by dielectrometry or dielectric analysis with higher degree of sensitivity, efficiency and resolution in comparision with the usual method in which the compatibility is assessed by the drooping characteristic of breakdown voltage according to UL-1446 [1]. It is also found a prediction of new prospect that may be feasible to accelerate the aging test of an insulation system associated with functional factors by dielectrometry.