1.82 μm像素间距量子点图像传感器短波红外成像研究

Jiwon Lee, Epimitheas Georgitzikis, Yunlong Li, Ziduo Lin, Jihoon Park, I. Lieberman, D. Cheyns, M. Jayapala, A. Lambrechts, S. Thijs, R. Stahl, P. Malinowski
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引用次数: 16

摘要

提出了一种用于短波红外(SWIR)范围的高像素密度图像传感器。将PbS量子点(QD)光电二极管阵列单片集成在硅自定义读出IC上。使用焦平面阵列演示了VIS和SWIR成像,像素间距降至1.82 μm。通过硅视觉和无透镜成像(LFI)显微镜显示的应用可以受益于高分辨率/小像素尺寸。在LFI演示中,捕获的全息图被计算重建以获得SWIR显微图像,从而产生波长等效分辨率的LFI显微系统。据我们所知,这是有史以来报道的最小螺距SWIR像素,也是第一个使用QD图像传感器的LFI系统。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Imaging in Short-Wave Infrared with 1.82 μm Pixel Pitch Quantum Dot Image Sensor
A high pixel density image sensor for the Short Wave Infrared (SWIR) range is presented. A PbS quantum dot (QD) photodiode array is monolithically integrated on a silicon custom readout IC. Imaging in VIS and SWIR is demonstrated using focal plane arrays with pixel pitch down to record 1.82 μm. Through-silicon vision and lens-free imaging (LFI) microscopy are shown as applications that can benefit from high resolution/small pixel dimensions. In the LFI demonstration, the captured hologram is computationally reconstructed to acquire SWIR microscopic images, resulting in a wavelength equivalent resolution LFI microscopy system. To our knowledge, this is the smallest pitch SWIR pixel ever reported and the first LFI system using a QD image sensor.
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