{"title":"使用铜蒸汽激光器的a- si激光结晶:光伏应用的不同选择","authors":"M. Boreland","doi":"10.1109/PVSC.1997.654198","DOIUrl":null,"url":null,"abstract":"The copper vapour laser (CVL) provides a pathway to relax some of the sample restrictions encountered by excimer lasers, and allow reapplication of the techniques developed for excimer lasers. Using a CVL focused spot, combined with low temperature substrate heating (/spl les/300/spl deg/C) to control the solidification velocity, grain sizes up to 0.445 /spl mu/m have been achieved, with an area weighted average up to 0.243 /spl mu/m. These grain sizes, which are comparable to reports using excimer lasers on much thinner films, were achieved on 1 /spl mu/m thick PECVD a-Si on quartz substrates making them potentially of interest for photovoltaic devices. Crystallinity was characterised using FESEM and Raman measurements.","PeriodicalId":251166,"journal":{"name":"Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997","volume":"2017 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Laser crystallisation of a-Si using copper vapour lasers: a different option for photovoltaic applications\",\"authors\":\"M. Boreland\",\"doi\":\"10.1109/PVSC.1997.654198\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The copper vapour laser (CVL) provides a pathway to relax some of the sample restrictions encountered by excimer lasers, and allow reapplication of the techniques developed for excimer lasers. Using a CVL focused spot, combined with low temperature substrate heating (/spl les/300/spl deg/C) to control the solidification velocity, grain sizes up to 0.445 /spl mu/m have been achieved, with an area weighted average up to 0.243 /spl mu/m. These grain sizes, which are comparable to reports using excimer lasers on much thinner films, were achieved on 1 /spl mu/m thick PECVD a-Si on quartz substrates making them potentially of interest for photovoltaic devices. Crystallinity was characterised using FESEM and Raman measurements.\",\"PeriodicalId\":251166,\"journal\":{\"name\":\"Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997\",\"volume\":\"2017 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-09-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC.1997.654198\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the Twenty Sixth IEEE Photovoltaic Specialists Conference - 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.1997.654198","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Laser crystallisation of a-Si using copper vapour lasers: a different option for photovoltaic applications
The copper vapour laser (CVL) provides a pathway to relax some of the sample restrictions encountered by excimer lasers, and allow reapplication of the techniques developed for excimer lasers. Using a CVL focused spot, combined with low temperature substrate heating (/spl les/300/spl deg/C) to control the solidification velocity, grain sizes up to 0.445 /spl mu/m have been achieved, with an area weighted average up to 0.243 /spl mu/m. These grain sizes, which are comparable to reports using excimer lasers on much thinner films, were achieved on 1 /spl mu/m thick PECVD a-Si on quartz substrates making them potentially of interest for photovoltaic devices. Crystallinity was characterised using FESEM and Raman measurements.