{"title":"表面效应下TRL辅助低损耗负折射率超材料表征","authors":"K. Eccleston, I. Platt, I. Woodhead, A. Tan","doi":"10.1109/IMaRC45935.2019.9118613","DOIUrl":null,"url":null,"abstract":"The characterization of metamaterials requires simulating or measuring samples with finite thickness. However, finite sized samples result in surface artefacts which cause an inconsistent wave-impedance to be retrieved when applying the Nicolson-Ross-Weir (NRW) method to low loss metamaterials. A method is demonstrated that uses thru-line (TL) deembedding to isolate the surface artefact allowing the NRW method to obtain consistent values of wave-impedance.","PeriodicalId":338001,"journal":{"name":"2019 IEEE MTT-S International Microwave and RF Conference (IMARC)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"TRL Assisted Low-loss Negative-Refractive-Index Metamaterial Characterization in the Presence of Surface Effects\",\"authors\":\"K. Eccleston, I. Platt, I. Woodhead, A. Tan\",\"doi\":\"10.1109/IMaRC45935.2019.9118613\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The characterization of metamaterials requires simulating or measuring samples with finite thickness. However, finite sized samples result in surface artefacts which cause an inconsistent wave-impedance to be retrieved when applying the Nicolson-Ross-Weir (NRW) method to low loss metamaterials. A method is demonstrated that uses thru-line (TL) deembedding to isolate the surface artefact allowing the NRW method to obtain consistent values of wave-impedance.\",\"PeriodicalId\":338001,\"journal\":{\"name\":\"2019 IEEE MTT-S International Microwave and RF Conference (IMARC)\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE MTT-S International Microwave and RF Conference (IMARC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMaRC45935.2019.9118613\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE MTT-S International Microwave and RF Conference (IMARC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMaRC45935.2019.9118613","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
TRL Assisted Low-loss Negative-Refractive-Index Metamaterial Characterization in the Presence of Surface Effects
The characterization of metamaterials requires simulating or measuring samples with finite thickness. However, finite sized samples result in surface artefacts which cause an inconsistent wave-impedance to be retrieved when applying the Nicolson-Ross-Weir (NRW) method to low loss metamaterials. A method is demonstrated that uses thru-line (TL) deembedding to isolate the surface artefact allowing the NRW method to obtain consistent values of wave-impedance.
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