磁场对半导体中带电载流子寿命稳定性的影响

T. Muratov
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引用次数: 0

摘要

在工作中,分析了低温1 ~ 10k和经典强磁场3 × 102 ~ 3 × 104 gse下半导体中复合工艺对载流子寿命增加的调控条件。载流子浓度1010-1014)cm−3的值对应于级联和共振捕获的表现条件。指出在库仑中心的级联俘获中,必须考虑电子在声子上的散射和电子-电子碰撞。如所示(基于具体估计),即在级联捕获时声子的散射,寿命稳定性和动力学控制在“强”磁场存在下增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect stability of lifetime of charged carrier in semiconductors at a magnetic field
In work the conditions of regulation of increasing of carrier lifetime by recombination processes in semiconductors at low temperatures 1–10 K and classically «strong» magnetic fields 3 × 102 –3 × 104 Gs are analyzed. The values of carrier concentrations 1010 –1014) cm−3 correspond to conditions of manifestation as cascade as resonant capture. It is indicated on necessarily to take into account of scattering of electrons on acoustic phonons along with electron-electron collisions, by it cascade capture on coulomb centers. As showed (on the basis of concrete estimates) namely scattering on acoustic phonons at cascade capture, stabilities of lifetime and controls of dynamics it increase in the presence of «strong» magnetic field.
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