{"title":"使用CLEAN的三维显微镜中重叠点源的最大似然定位","authors":"M. Handley, G. Carles, A. Harvey","doi":"10.1364/COSI.2019.JW2A.18","DOIUrl":null,"url":null,"abstract":"Precise 3D point localization is increasingly important in microscopy, but algorithms break down when PSFs overlap. We adapt the CLEAN algorithm from astronomical imaging to enable MLE localization of high-density datasets.","PeriodicalId":123636,"journal":{"name":"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Maximum-likelihood localization of overlapping point sources in 3D microscopy using CLEAN\",\"authors\":\"M. Handley, G. Carles, A. Harvey\",\"doi\":\"10.1364/COSI.2019.JW2A.18\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Precise 3D point localization is increasingly important in microscopy, but algorithms break down when PSFs overlap. We adapt the CLEAN algorithm from astronomical imaging to enable MLE localization of high-density datasets.\",\"PeriodicalId\":123636,\"journal\":{\"name\":\"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/COSI.2019.JW2A.18\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/COSI.2019.JW2A.18","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Maximum-likelihood localization of overlapping point sources in 3D microscopy using CLEAN
Precise 3D point localization is increasingly important in microscopy, but algorithms break down when PSFs overlap. We adapt the CLEAN algorithm from astronomical imaging to enable MLE localization of high-density datasets.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
