M. Ayliffe, M. Cheng, L. Chirovsky, C. Ciesla, S. Demars, C. Hart, G. Hasnain, W. Hogan, S. Hu, K. Jackson, W. Jiang, D. Lewis, M. Murty, C. Shieh, D. Sun, I.-H. Tan, D. Venables
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A Non-Oxide 850 nm VCSEL for High-Speed Datacom Applications
We have developed an 850 nm VCSEL where current and photon confinement is achieved by a mesa structure without lateral oxidation. The VCSEL performance and reliability is discussed in the context of 4xFC and 10 GbE applications.