J.M. Li, L. P. Shi, H.X. Yang, K. G. Lim, X. Miao, H.K. Lee, T. Chong
{"title":"相变随机存取存储器(PCRAM)单元的集成分析与设计","authors":"J.M. Li, L. P. Shi, H.X. Yang, K. G. Lim, X. Miao, H.K. Lee, T. Chong","doi":"10.1109/NVMT.2006.378880","DOIUrl":null,"url":null,"abstract":"An integrated software for analysis and design of PCRAM cells has been developed. The research focuses on the discussion on electric-thermal -mechanical analyses. The software involves in the materials, geometrical and layer structure design and electric pulse strategy. It aims to provide a powerful tool for structure optimization and failure analysis of PCRAM cells.","PeriodicalId":263387,"journal":{"name":"2006 7th Annual Non-Volatile Memory Technology Symposium","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Integrated Analysis and Design of Phase-Change Random Access Memory (PCRAM) Cells\",\"authors\":\"J.M. Li, L. P. Shi, H.X. Yang, K. G. Lim, X. Miao, H.K. Lee, T. Chong\",\"doi\":\"10.1109/NVMT.2006.378880\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An integrated software for analysis and design of PCRAM cells has been developed. The research focuses on the discussion on electric-thermal -mechanical analyses. The software involves in the materials, geometrical and layer structure design and electric pulse strategy. It aims to provide a powerful tool for structure optimization and failure analysis of PCRAM cells.\",\"PeriodicalId\":263387,\"journal\":{\"name\":\"2006 7th Annual Non-Volatile Memory Technology Symposium\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 7th Annual Non-Volatile Memory Technology Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NVMT.2006.378880\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 7th Annual Non-Volatile Memory Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NVMT.2006.378880","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Integrated Analysis and Design of Phase-Change Random Access Memory (PCRAM) Cells
An integrated software for analysis and design of PCRAM cells has been developed. The research focuses on the discussion on electric-thermal -mechanical analyses. The software involves in the materials, geometrical and layer structure design and electric pulse strategy. It aims to provide a powerful tool for structure optimization and failure analysis of PCRAM cells.