{"title":"改进的RAID存储系统可靠性建模","authors":"J. Elerath, M. Pecht","doi":"10.1109/DSN.2007.41","DOIUrl":null,"url":null,"abstract":"A flexible model for estimating reliability of RAID storage systems is presented. This model corrects errors associated with the common assumption that system times to failure follow a homogeneous Poisson process. Separate generalized failure distributions are used to model catastrophic failures and usage dependent data corruptions for each hard drive. Catastrophic failure restoration is represented by a three-parameter Weibull, so the model can include a minimum time to restore as a function of data transfer rate and hard drive storage capacity. Data can be scrubbed as a background operation to eliminate corrupted data that, in the event of a simultaneous catastrophic failure, results in double disk failures. Field-based times to failure data and mathematic justification for a new model are presented. Model results have been verified and predict between 2 to 1,500 times as many double disk failures as that estimated using the current mean time to data loss method.","PeriodicalId":405751,"journal":{"name":"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"105","resultStr":"{\"title\":\"Enhanced Reliability Modeling of RAID Storage Systems\",\"authors\":\"J. Elerath, M. Pecht\",\"doi\":\"10.1109/DSN.2007.41\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A flexible model for estimating reliability of RAID storage systems is presented. This model corrects errors associated with the common assumption that system times to failure follow a homogeneous Poisson process. Separate generalized failure distributions are used to model catastrophic failures and usage dependent data corruptions for each hard drive. Catastrophic failure restoration is represented by a three-parameter Weibull, so the model can include a minimum time to restore as a function of data transfer rate and hard drive storage capacity. Data can be scrubbed as a background operation to eliminate corrupted data that, in the event of a simultaneous catastrophic failure, results in double disk failures. Field-based times to failure data and mathematic justification for a new model are presented. Model results have been verified and predict between 2 to 1,500 times as many double disk failures as that estimated using the current mean time to data loss method.\",\"PeriodicalId\":405751,\"journal\":{\"name\":\"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)\",\"volume\":\"47 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"105\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DSN.2007.41\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"37th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN'07)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DSN.2007.41","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Enhanced Reliability Modeling of RAID Storage Systems
A flexible model for estimating reliability of RAID storage systems is presented. This model corrects errors associated with the common assumption that system times to failure follow a homogeneous Poisson process. Separate generalized failure distributions are used to model catastrophic failures and usage dependent data corruptions for each hard drive. Catastrophic failure restoration is represented by a three-parameter Weibull, so the model can include a minimum time to restore as a function of data transfer rate and hard drive storage capacity. Data can be scrubbed as a background operation to eliminate corrupted data that, in the event of a simultaneous catastrophic failure, results in double disk failures. Field-based times to failure data and mathematic justification for a new model are presented. Model results have been verified and predict between 2 to 1,500 times as many double disk failures as that estimated using the current mean time to data loss method.